Improved control and characterization of adjustable x-ray optics

Ryan Allured, Sagi Ben-Ami, Vincenzo Cotroneo, Vanessa Marquez, Stuart McMuldroch, Paul B. Reid, Daniel A. Schwartz, Susan Trolier-McKinstry, Alexey A. Vikhlinin, Margeaux L. Wallace

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

We report on improvements in our efforts to control and characterize piezoelectrically adjustable, thin glass optics. In the past, an optical profilometer and a Shack-Hartmann wavefront sensor have been used to measure influence functions for a at adjustable mirror. An electronics system has since been developed to control > 100 actuator cells and has been used in a full calibration of a high-yield at adjustable mirror. The calibrated influence functions have been used to induce a pre-determined figure change to the mirror, representing our first attempt at figure control of a full mirror. Furthermore, we have adapted our metrology systems for cylindrical optics, allowing characterization of Wolter-type mirrors. We plan to use this metrology to perform the first piezoelectric figure correction of a cylindrical mirror over the next year.

Original languageEnglish (US)
Title of host publicationOptics for EUV, X-Ray, and Gamma-Ray Astronomy VII
EditorsGiovanni Pareschi, Stephen L. O'Dell, Giovanni Pareschi, Stephen L. O'Dell
PublisherSPIE
ISBN (Electronic)9781628417692, 9781628417692
DOIs
StatePublished - Jan 1 2015
EventOptics for EUV, X-Ray, and Gamma-Ray Astronomy VII - San Diego, United States
Duration: Aug 10 2015Aug 13 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9603
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherOptics for EUV, X-Ray, and Gamma-Ray Astronomy VII
CountryUnited States
CitySan Diego
Period8/10/158/13/15

Fingerprint

x ray optics
X-ray Optics
Optics
Mirror
Mirrors
mirrors
X rays
Figure
Influence Function
Metrology
metrology
optics
Shack-Hartmann Wavefront Sensor
Wavefronts
profilometers
Electronic equipment
Actuators
Calibration
Actuator
Glass

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Allured, R., Ben-Ami, S., Cotroneo, V., Marquez, V., McMuldroch, S., Reid, P. B., ... Wallace, M. L. (2015). Improved control and characterization of adjustable x-ray optics. In G. Pareschi, S. L. O'Dell, G. Pareschi, & S. L. O'Dell (Eds.), Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII [96031M] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9603). SPIE. https://doi.org/10.1117/12.2186411
Allured, Ryan ; Ben-Ami, Sagi ; Cotroneo, Vincenzo ; Marquez, Vanessa ; McMuldroch, Stuart ; Reid, Paul B. ; Schwartz, Daniel A. ; Trolier-McKinstry, Susan ; Vikhlinin, Alexey A. ; Wallace, Margeaux L. / Improved control and characterization of adjustable x-ray optics. Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII. editor / Giovanni Pareschi ; Stephen L. O'Dell ; Giovanni Pareschi ; Stephen L. O'Dell. SPIE, 2015. (Proceedings of SPIE - The International Society for Optical Engineering).
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abstract = "We report on improvements in our efforts to control and characterize piezoelectrically adjustable, thin glass optics. In the past, an optical profilometer and a Shack-Hartmann wavefront sensor have been used to measure influence functions for a at adjustable mirror. An electronics system has since been developed to control > 100 actuator cells and has been used in a full calibration of a high-yield at adjustable mirror. The calibrated influence functions have been used to induce a pre-determined figure change to the mirror, representing our first attempt at figure control of a full mirror. Furthermore, we have adapted our metrology systems for cylindrical optics, allowing characterization of Wolter-type mirrors. We plan to use this metrology to perform the first piezoelectric figure correction of a cylindrical mirror over the next year.",
author = "Ryan Allured and Sagi Ben-Ami and Vincenzo Cotroneo and Vanessa Marquez and Stuart McMuldroch and Reid, {Paul B.} and Schwartz, {Daniel A.} and Susan Trolier-McKinstry and Vikhlinin, {Alexey A.} and Wallace, {Margeaux L.}",
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Allured, R, Ben-Ami, S, Cotroneo, V, Marquez, V, McMuldroch, S, Reid, PB, Schwartz, DA, Trolier-McKinstry, S, Vikhlinin, AA & Wallace, ML 2015, Improved control and characterization of adjustable x-ray optics. in G Pareschi, SL O'Dell, G Pareschi & SL O'Dell (eds), Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII., 96031M, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9603, SPIE, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, San Diego, United States, 8/10/15. https://doi.org/10.1117/12.2186411

Improved control and characterization of adjustable x-ray optics. / Allured, Ryan; Ben-Ami, Sagi; Cotroneo, Vincenzo; Marquez, Vanessa; McMuldroch, Stuart; Reid, Paul B.; Schwartz, Daniel A.; Trolier-McKinstry, Susan; Vikhlinin, Alexey A.; Wallace, Margeaux L.

Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII. ed. / Giovanni Pareschi; Stephen L. O'Dell; Giovanni Pareschi; Stephen L. O'Dell. SPIE, 2015. 96031M (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9603).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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AU - Schwartz, Daniel A.

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AU - Vikhlinin, Alexey A.

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AB - We report on improvements in our efforts to control and characterize piezoelectrically adjustable, thin glass optics. In the past, an optical profilometer and a Shack-Hartmann wavefront sensor have been used to measure influence functions for a at adjustable mirror. An electronics system has since been developed to control > 100 actuator cells and has been used in a full calibration of a high-yield at adjustable mirror. The calibrated influence functions have been used to induce a pre-determined figure change to the mirror, representing our first attempt at figure control of a full mirror. Furthermore, we have adapted our metrology systems for cylindrical optics, allowing characterization of Wolter-type mirrors. We plan to use this metrology to perform the first piezoelectric figure correction of a cylindrical mirror over the next year.

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Allured R, Ben-Ami S, Cotroneo V, Marquez V, McMuldroch S, Reid PB et al. Improved control and characterization of adjustable x-ray optics. In Pareschi G, O'Dell SL, Pareschi G, O'Dell SL, editors, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII. SPIE. 2015. 96031M. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.2186411