Improvements in SIMS continue. Is the end in sight?

Nicholas Winograd, Zbigniew Postawa, Juan Cheng, Christopher Szakal, Joseph Kozole, Barbara Jane Garrison

Research output: Contribution to journalArticle

61 Citations (Scopus)

Abstract

Cluster ion bombardment is at the forefront of current ToF-SIMS research, particularly when examining the feasibility of molecular depth profiling and three-dimensional imaging applications. It has become increasingly clear that secondary ion emission after cluster projectile impact results from a radically different sputtering mechanism than the linear collision cascades that dominate after atomic ion bombardment. The new physics involved with cluster ion impacts dramatically change the traditional approaches toward sample analysis with the SIMS technique. Several new ion bombardment properties have emerged from experimental and theoretical work involving cluster ions such as Au 3 + , Bi 3 + , SF 5 + , and C 60 + -all of which are commercially available ion sources. These new properties lead to new rules for traditional static SIMS experiments, provoking new methodologies, and introducing new applications-especially where high mass sensitivity and high-resolution imaging of organic and biological materials are necessary. This paper aims to elucidate recent experimental and theoretical work on these new cluster ion properties and offers insights into how these special properties can be used for future experiments and applications.

Original languageEnglish (US)
Pages (from-to)6836-6843
Number of pages8
JournalApplied Surface Science
Volume252
Issue number19
DOIs
StatePublished - Jul 30 2006

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Secondary ion mass spectrometry
Ion bombardment
Ions
Imaging techniques
Depth profiling
Ion sources
Projectiles
Biological materials
Sputtering
Physics
Experiments

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

Cite this

Winograd, N., Postawa, Z., Cheng, J., Szakal, C., Kozole, J., & Garrison, B. J. (2006). Improvements in SIMS continue. Is the end in sight? Applied Surface Science, 252(19), 6836-6843. https://doi.org/10.1016/j.apsusc.2006.02.142
Winograd, Nicholas ; Postawa, Zbigniew ; Cheng, Juan ; Szakal, Christopher ; Kozole, Joseph ; Garrison, Barbara Jane. / Improvements in SIMS continue. Is the end in sight?. In: Applied Surface Science. 2006 ; Vol. 252, No. 19. pp. 6836-6843.
@article{358671c070dc42be9adcea49390780f8,
title = "Improvements in SIMS continue. Is the end in sight?",
abstract = "Cluster ion bombardment is at the forefront of current ToF-SIMS research, particularly when examining the feasibility of molecular depth profiling and three-dimensional imaging applications. It has become increasingly clear that secondary ion emission after cluster projectile impact results from a radically different sputtering mechanism than the linear collision cascades that dominate after atomic ion bombardment. The new physics involved with cluster ion impacts dramatically change the traditional approaches toward sample analysis with the SIMS technique. Several new ion bombardment properties have emerged from experimental and theoretical work involving cluster ions such as Au 3 + , Bi 3 + , SF 5 + , and C 60 + -all of which are commercially available ion sources. These new properties lead to new rules for traditional static SIMS experiments, provoking new methodologies, and introducing new applications-especially where high mass sensitivity and high-resolution imaging of organic and biological materials are necessary. This paper aims to elucidate recent experimental and theoretical work on these new cluster ion properties and offers insights into how these special properties can be used for future experiments and applications.",
author = "Nicholas Winograd and Zbigniew Postawa and Juan Cheng and Christopher Szakal and Joseph Kozole and Garrison, {Barbara Jane}",
year = "2006",
month = "7",
day = "30",
doi = "10.1016/j.apsusc.2006.02.142",
language = "English (US)",
volume = "252",
pages = "6836--6843",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier",
number = "19",

}

Winograd, N, Postawa, Z, Cheng, J, Szakal, C, Kozole, J & Garrison, BJ 2006, 'Improvements in SIMS continue. Is the end in sight?', Applied Surface Science, vol. 252, no. 19, pp. 6836-6843. https://doi.org/10.1016/j.apsusc.2006.02.142

Improvements in SIMS continue. Is the end in sight? / Winograd, Nicholas; Postawa, Zbigniew; Cheng, Juan; Szakal, Christopher; Kozole, Joseph; Garrison, Barbara Jane.

In: Applied Surface Science, Vol. 252, No. 19, 30.07.2006, p. 6836-6843.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Improvements in SIMS continue. Is the end in sight?

AU - Winograd, Nicholas

AU - Postawa, Zbigniew

AU - Cheng, Juan

AU - Szakal, Christopher

AU - Kozole, Joseph

AU - Garrison, Barbara Jane

PY - 2006/7/30

Y1 - 2006/7/30

N2 - Cluster ion bombardment is at the forefront of current ToF-SIMS research, particularly when examining the feasibility of molecular depth profiling and three-dimensional imaging applications. It has become increasingly clear that secondary ion emission after cluster projectile impact results from a radically different sputtering mechanism than the linear collision cascades that dominate after atomic ion bombardment. The new physics involved with cluster ion impacts dramatically change the traditional approaches toward sample analysis with the SIMS technique. Several new ion bombardment properties have emerged from experimental and theoretical work involving cluster ions such as Au 3 + , Bi 3 + , SF 5 + , and C 60 + -all of which are commercially available ion sources. These new properties lead to new rules for traditional static SIMS experiments, provoking new methodologies, and introducing new applications-especially where high mass sensitivity and high-resolution imaging of organic and biological materials are necessary. This paper aims to elucidate recent experimental and theoretical work on these new cluster ion properties and offers insights into how these special properties can be used for future experiments and applications.

AB - Cluster ion bombardment is at the forefront of current ToF-SIMS research, particularly when examining the feasibility of molecular depth profiling and three-dimensional imaging applications. It has become increasingly clear that secondary ion emission after cluster projectile impact results from a radically different sputtering mechanism than the linear collision cascades that dominate after atomic ion bombardment. The new physics involved with cluster ion impacts dramatically change the traditional approaches toward sample analysis with the SIMS technique. Several new ion bombardment properties have emerged from experimental and theoretical work involving cluster ions such as Au 3 + , Bi 3 + , SF 5 + , and C 60 + -all of which are commercially available ion sources. These new properties lead to new rules for traditional static SIMS experiments, provoking new methodologies, and introducing new applications-especially where high mass sensitivity and high-resolution imaging of organic and biological materials are necessary. This paper aims to elucidate recent experimental and theoretical work on these new cluster ion properties and offers insights into how these special properties can be used for future experiments and applications.

UR - http://www.scopus.com/inward/record.url?scp=33747180853&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33747180853&partnerID=8YFLogxK

U2 - 10.1016/j.apsusc.2006.02.142

DO - 10.1016/j.apsusc.2006.02.142

M3 - Article

AN - SCOPUS:33747180853

VL - 252

SP - 6836

EP - 6843

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

IS - 19

ER -

Winograd N, Postawa Z, Cheng J, Szakal C, Kozole J, Garrison BJ. Improvements in SIMS continue. Is the end in sight? Applied Surface Science. 2006 Jul 30;252(19):6836-6843. https://doi.org/10.1016/j.apsusc.2006.02.142