Improving the Charge/Discharge Efficiency and Dielectric Breakdown in High Temperature Polymer Dielectrics

Xin Chen, Tian Zhang, Qiming Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Dielectric polymers which can operate at high temperature (> 150 °C) and high electric fields with high performance such as high charge/discharge efficiency and dielectric strength are required for many capacitor applications including energy storage and electric insulators. These dielectric performances are controlled directly by charge injection and conduction at high fields and high temperature. Nanoparticles, through interfacial effects, can markedly influence dielectric properties of the matrix. Here we report a research on a significantly enhanced charge/discharge efficiency in high glass transition temperature polymer, i. e. polymers in PEEK family by doping with very small amount of nanoparticles. The presence of nanoparticles reduces the leakage current of the polymer matrix in the conditions of high electric field and high temperature. Our results demonstrate a practicable way to enhance the performance of polymer-based capacitors working at high temperature and high electric field.

Original languageEnglish (US)
Title of host publication2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages98-100
Number of pages3
Volume2018-October
ISBN (Electronic)9781538661925
DOIs
StatePublished - Nov 26 2018
Event2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018 - Cancun, Mexico
Duration: Oct 21 2018Oct 24 2018

Other

Other2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018
CountryMexico
CityCancun
Period10/21/1810/24/18

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Electric breakdown
Polymers
Electric fields
Nanoparticles
Electric insulators
Capacitors
Temperature
Charge injection
Polyether ether ketones
Polymer matrix
Leakage currents
Dielectric properties
Energy storage
Doping (additives)

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Chen, X., Zhang, T., & Zhang, Q. (2018). Improving the Charge/Discharge Efficiency and Dielectric Breakdown in High Temperature Polymer Dielectrics. In 2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018 (Vol. 2018-October, pp. 98-100). [8544748] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CEIDP.2018.8544748
Chen, Xin ; Zhang, Tian ; Zhang, Qiming. / Improving the Charge/Discharge Efficiency and Dielectric Breakdown in High Temperature Polymer Dielectrics. 2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018. Vol. 2018-October Institute of Electrical and Electronics Engineers Inc., 2018. pp. 98-100
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abstract = "Dielectric polymers which can operate at high temperature (> 150 °C) and high electric fields with high performance such as high charge/discharge efficiency and dielectric strength are required for many capacitor applications including energy storage and electric insulators. These dielectric performances are controlled directly by charge injection and conduction at high fields and high temperature. Nanoparticles, through interfacial effects, can markedly influence dielectric properties of the matrix. Here we report a research on a significantly enhanced charge/discharge efficiency in high glass transition temperature polymer, i. e. polymers in PEEK family by doping with very small amount of nanoparticles. The presence of nanoparticles reduces the leakage current of the polymer matrix in the conditions of high electric field and high temperature. Our results demonstrate a practicable way to enhance the performance of polymer-based capacitors working at high temperature and high electric field.",
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Chen, X, Zhang, T & Zhang, Q 2018, Improving the Charge/Discharge Efficiency and Dielectric Breakdown in High Temperature Polymer Dielectrics. in 2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018. vol. 2018-October, 8544748, Institute of Electrical and Electronics Engineers Inc., pp. 98-100, 2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018, Cancun, Mexico, 10/21/18. https://doi.org/10.1109/CEIDP.2018.8544748

Improving the Charge/Discharge Efficiency and Dielectric Breakdown in High Temperature Polymer Dielectrics. / Chen, Xin; Zhang, Tian; Zhang, Qiming.

2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018. Vol. 2018-October Institute of Electrical and Electronics Engineers Inc., 2018. p. 98-100 8544748.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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AB - Dielectric polymers which can operate at high temperature (> 150 °C) and high electric fields with high performance such as high charge/discharge efficiency and dielectric strength are required for many capacitor applications including energy storage and electric insulators. These dielectric performances are controlled directly by charge injection and conduction at high fields and high temperature. Nanoparticles, through interfacial effects, can markedly influence dielectric properties of the matrix. Here we report a research on a significantly enhanced charge/discharge efficiency in high glass transition temperature polymer, i. e. polymers in PEEK family by doping with very small amount of nanoparticles. The presence of nanoparticles reduces the leakage current of the polymer matrix in the conditions of high electric field and high temperature. Our results demonstrate a practicable way to enhance the performance of polymer-based capacitors working at high temperature and high electric field.

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Chen X, Zhang T, Zhang Q. Improving the Charge/Discharge Efficiency and Dielectric Breakdown in High Temperature Polymer Dielectrics. In 2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018. Vol. 2018-October. Institute of Electrical and Electronics Engineers Inc. 2018. p. 98-100. 8544748 https://doi.org/10.1109/CEIDP.2018.8544748