In-situ creep specimen monitoring: A comparison of guided wave and local transducer techniques

Manton J. Guers, Bernhard R. Tittmann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Performing in-situ measurements of specimens in research reactors is challenging because of the environmental conditions. In this paper, two approaches were investigated for performing in-situ measurements of the change in length of creep specimens. In the first method, the transducer is located outside the hostile environment, and the specimen is interrogated by transmitting ultrasonic guided waves down a wire waveguide to the creep specimen. In the second method, a piezoelectric element is mounted directly to the creep specimen. If the piezoelectric element can withstand the operating environment, higher resolution and more compact specimen design can be achieved with the directly mounted transducer elements.

Original languageEnglish (US)
Title of host publication43rd Annual Review of Progress in Quantitative Nondestructive Evaluation, Volume 36
EditorsLeonard J. Bond, Dale E. Chimenti
PublisherAmerican Institute of Physics Inc.
ISBN (Electronic)9780735414747
DOIs
StatePublished - Feb 16 2017
Event43rd Annual Review of Progress in Quantitative Nondestructive Evaluation, QNDE 2016 - Atlanta, United States
Duration: Jul 17 2016Jul 22 2016

Publication series

NameAIP Conference Proceedings
Volume1806
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other43rd Annual Review of Progress in Quantitative Nondestructive Evaluation, QNDE 2016
CountryUnited States
CityAtlanta
Period7/17/167/22/16

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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    Guers, M. J., & Tittmann, B. R. (2017). In-situ creep specimen monitoring: A comparison of guided wave and local transducer techniques. In L. J. Bond, & D. E. Chimenti (Eds.), 43rd Annual Review of Progress in Quantitative Nondestructive Evaluation, Volume 36 [050004] (AIP Conference Proceedings; Vol. 1806). American Institute of Physics Inc.. https://doi.org/10.1063/1.4974598