In situ high temperature atomic resolution transmission electron microscopy of 2D nanomaterials

Ashley L. Gibb, Nasim Alem, Jian Hao Chen, Jim Ciston, Alex Zettl

Research output: Contribution to journalConference article

Original languageEnglish (US)
Pages (from-to)1770-1771
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

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Nanostructured materials
Transmission electron microscopy
transmission electron microscopy
Temperature

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Gibb, Ashley L. ; Alem, Nasim ; Chen, Jian Hao ; Ciston, Jim ; Zettl, Alex. / In situ high temperature atomic resolution transmission electron microscopy of 2D nanomaterials. In: Microscopy and Microanalysis. 2014 ; Vol. 20, No. 3. pp. 1770-1771.
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In situ high temperature atomic resolution transmission electron microscopy of 2D nanomaterials. / Gibb, Ashley L.; Alem, Nasim; Chen, Jian Hao; Ciston, Jim; Zettl, Alex.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.08.2014, p. 1770-1771.

Research output: Contribution to journalConference article

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