In-situ probing of domain poling in Bi 4Ti 3O 12 thin films by optical second harmonic generation

Yaniv Barad, Venkatraman Gopalan

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

We quantitatively track in real-time, the changes in domain statistics with electric field poling, of a ferroelectric Bi 4Ti 3O 12 thin film using optical second harmonic generation as a probe. The ferroelectric hysteresis loop is extracted from these optical measurements using a theoretical model. The model also yields ratios of intrinsic nonlinear coefficients such as d 11/d 12 = -3.54 ±0.31, d 26/d 11 = 0.4 ±0.03, and optical birefringence |n b - n a| = 0.079 ±0.015.

Original languageEnglish (US)
Pages (from-to)19-24
Number of pages6
JournalIntegrated Ferroelectrics
Volume44
DOIs
StatePublished - Dec 1 2002

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Ceramics and Composites
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Fingerprint Dive into the research topics of 'In-situ probing of domain poling in Bi <sub>4</sub>Ti <sub>3</sub>O <sub>12</sub> thin films by optical second harmonic generation'. Together they form a unique fingerprint.

Cite this