Increasing data TLB resilience to transient errors

Feihui Li; Mahmut Kandemir

Increasing data TLB resilience to transient errors

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper first demonstrates that a large fraction of data TLB entries are dead (i.e., not used again before being replaced) for many applications at any given time during execution. Based on this observation, it then proposes two alternate schemes that replicate actively accessed data TLB entries in these dead entries to increase the resilience of the TLB against transient errors.

Original language	English (US)
Title of host publication	Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI Design
Editors	A. Smailagic, N. Ranganathan
Pages	297-298
Number of pages	2
State	Published - Oct 25 2005
Event	IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI Design - Tampa, FL, United States Duration: May 11 2005 → May 12 2005

Publication series

Name	Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI

Other

Other	IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI Design
Country	United States
City	Tampa, FL
Period	5/11/05 → 5/12/05

All Science Journal Classification (ASJC) codes

Engineering(all)

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@inproceedings{63afe76df0c54f6da3321f0d1741403e,

title = "Increasing data TLB resilience to transient errors",

abstract = "This paper first demonstrates that a large fraction of data TLB entries are dead (i.e., not used again before being replaced) for many applications at any given time during execution. Based on this observation, it then proposes two alternate schemes that replicate actively accessed data TLB entries in these dead entries to increase the resilience of the TLB against transient errors.",

author = "Feihui Li and Mahmut Kandemir",

year = "2005",

month = oct,

day = "25",

language = "English (US)",

isbn = "076952365X",

series = "Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI",

pages = "297--298",

editor = "A. Smailagic and N. Ranganathan",

booktitle = "Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI Design",

note = "IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI Design ; Conference date: 11-05-2005 Through 12-05-2005",

}

Li, F & Kandemir, M 2005, Increasing data TLB resilience to transient errors. in A Smailagic & N Ranganathan (eds), Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI Design. Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI, pp. 297-298, IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI Design, Tampa, FL, United States, 5/11/05.

Increasing data TLB resilience to transient errors. / Li, Feihui; Kandemir, Mahmut.

Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI Design. ed. / A. Smailagic; N. Ranganathan. 2005. p. 297-298 (Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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BT - Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI Design

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