Inelastic electron tunneling spectroscopy measurements using adjustable oxide-free tunnel junctions

Darin T. Zimmerman, Glenn Agnolet

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

We report an adjustable, oxide-free tunnel junction for inelastic electron tunneling spectroscopy that is capable of detecting the vibrational modes of molecules adsorbed on clean metal surfaces. In this article, we describe the details of these junctions and the procedure by which the tunneling data is obtained and analyzed. We also describe a compact 4He cryostat that was built to test the properties of these junctions. The performance of the junctions is demonstrated with tunneling data taken with a neon - hydrogen film adsorbed on platinum.

Original languageEnglish (US)
Pages (from-to)1781-1787
Number of pages7
JournalReview of Scientific Instruments
Volume72
Issue number3
DOIs
StatePublished - Mar 1 2001

Fingerprint

Neon
Cryostats
Electron tunneling
Tunnel junctions
electron tunneling
tunnel junctions
Platinum
Spectroscopy
Hydrogen
Molecules
Oxides
oxides
Metals
spectroscopy
cryostats
neon
metal surfaces
vibration mode
platinum
hydrogen

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

@article{842d6e93eb664b7e8802f6aa0d364212,
title = "Inelastic electron tunneling spectroscopy measurements using adjustable oxide-free tunnel junctions",
abstract = "We report an adjustable, oxide-free tunnel junction for inelastic electron tunneling spectroscopy that is capable of detecting the vibrational modes of molecules adsorbed on clean metal surfaces. In this article, we describe the details of these junctions and the procedure by which the tunneling data is obtained and analyzed. We also describe a compact 4He cryostat that was built to test the properties of these junctions. The performance of the junctions is demonstrated with tunneling data taken with a neon - hydrogen film adsorbed on platinum.",
author = "Zimmerman, {Darin T.} and Glenn Agnolet",
year = "2001",
month = "3",
day = "1",
doi = "10.1063/1.1347382",
language = "English (US)",
volume = "72",
pages = "1781--1787",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "3",

}

Inelastic electron tunneling spectroscopy measurements using adjustable oxide-free tunnel junctions. / Zimmerman, Darin T.; Agnolet, Glenn.

In: Review of Scientific Instruments, Vol. 72, No. 3, 01.03.2001, p. 1781-1787.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Inelastic electron tunneling spectroscopy measurements using adjustable oxide-free tunnel junctions

AU - Zimmerman, Darin T.

AU - Agnolet, Glenn

PY - 2001/3/1

Y1 - 2001/3/1

N2 - We report an adjustable, oxide-free tunnel junction for inelastic electron tunneling spectroscopy that is capable of detecting the vibrational modes of molecules adsorbed on clean metal surfaces. In this article, we describe the details of these junctions and the procedure by which the tunneling data is obtained and analyzed. We also describe a compact 4He cryostat that was built to test the properties of these junctions. The performance of the junctions is demonstrated with tunneling data taken with a neon - hydrogen film adsorbed on platinum.

AB - We report an adjustable, oxide-free tunnel junction for inelastic electron tunneling spectroscopy that is capable of detecting the vibrational modes of molecules adsorbed on clean metal surfaces. In this article, we describe the details of these junctions and the procedure by which the tunneling data is obtained and analyzed. We also describe a compact 4He cryostat that was built to test the properties of these junctions. The performance of the junctions is demonstrated with tunneling data taken with a neon - hydrogen film adsorbed on platinum.

UR - http://www.scopus.com/inward/record.url?scp=0035274060&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035274060&partnerID=8YFLogxK

U2 - 10.1063/1.1347382

DO - 10.1063/1.1347382

M3 - Article

AN - SCOPUS:0035274060

VL - 72

SP - 1781

EP - 1787

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 3

ER -