Influence of interfacial properties on thermal transport at gold:silicon contacts

J. C. Duda, C. Y.P. Yang, B. M. Foley, R. Cheaito, D. L. Medlin, R. E. Jones, P. E. Hopkins

Research output: Contribution to journalArticlepeer-review

54 Scopus citations

Abstract

We measure the Kapitza conductances at Au:Si contacts from 100 to 296 K via time-domain thermoreflectance. Contacts are fabricated by evaporating Au films onto Si substrates. Prior to Au deposition, the Si substrates receive pretreatments in order to modify interfacial properties, i.e., bonding and structural disorder. Through the inclusion of a Ti adhesion layer and the removal of the native oxide, Kapitza conductance can be enhanced by a factor of four at 296 K. Furthermore, interfacial roughness is found to have a negligible effect, which we attribute to the already low conductances of poorly bonded Au:Si contacts.

Original languageEnglish (US)
Article number081902
JournalApplied Physics Letters
Volume102
Issue number8
DOIs
StatePublished - Feb 25 2013

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Influence of interfacial properties on thermal transport at gold:silicon contacts'. Together they form a unique fingerprint.

Cite this