Influence of surface transition layers on phase transformation and pyroelectric properties of ferroelectric thin film

Pu Nan Sun, Tian Quan Lü, Hui Chen, Wenwu Cao

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Abstract

Taking into account surface transition layers (STLs), we study the phase transformation and pyroelectric properties of ferroelectric thin films by employing the transverse Ising model (TIM) in the framework of the mean field approximation. The distribution functions representing the intra-layer and inter-layer couplings between the two nearest neighbour pseudo-spins are introduced to characterize STLs. Compared with the results obtained by the traditional treatments for the thin films using only the single surface transition layer (SSL), it is shown that the STL model reflects a more realistic and comprehensive situation of films. The effects of various parameters on the phase transformation properties have shown that STL can make the Curie temperature of the film higher or lower than that of the corresponding bulk material, and the thickness of STL is a key factor influencing the film properties. For a film with definite thickness, there exists a critical STL thickness at which ferroelectricity will disappear when the intra-layer and inter-layer interactions are weak.

Original languageEnglish (US)
Pages (from-to)3422-3425
Number of pages4
JournalChinese Physics Letters
Volume25
Issue number9
DOIs
StatePublished - Sep 1 2008

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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