Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

Oana D. Jurchescu, Behrang H. Hamadani, Hao Xiong, Sungkyu K. Park, Sankar Subramanian, Neil M. Zimmerman, John Anthony, Thomas Nelson Jackson, David J. Gundlach

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publication2007 International Semiconductor Device Research Symposium, ISDRS
DOIs
StatePublished - Dec 1 2007
Event2007 International Semiconductor Device Research Symposium, ISDRS - College Park, MD, United States
Duration: Dec 12 2007Dec 14 2007

Other

Other2007 International Semiconductor Device Research Symposium, ISDRS
CountryUnited States
CityCollege Park, MD
Period12/12/0712/14/07

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Jurchescu, O. D., Hamadani, B. H., Xiong, H., Park, S. K., Subramanian, S., Zimmerman, N. M., Anthony, J., Jackson, T. N., & Gundlach, D. J. (2007). Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors. In 2007 International Semiconductor Device Research Symposium, ISDRS [4422500] https://doi.org/10.1109/ISDRS.2007.4422500