Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

Oana D. Jurchescu; Behrang H. Hamadani; Hao Xiong; Sungkyu K. Park; Sankar Subramanian; Neil M. Zimmerman; John Anthony; Thomas Nelson Jackson; David J. Gundlach

doi:10.1109/ISDRS.2007.4422500

Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

Oana D. Jurchescu, Behrang H. Hamadani, Hao Xiong, Sungkyu K. Park, Sankar Subramanian, Neil M. Zimmerman, John Anthony, Thomas Nelson Jackson, David J. Gundlach

Materials Research Institute (MRI)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	2007 International Semiconductor Device Research Symposium, ISDRS
DOIs	https://doi.org/10.1109/ISDRS.2007.4422500
State	Published - Dec 1 2007
Event	2007 International Semiconductor Device Research Symposium, ISDRS - College Park, MD, United States Duration: Dec 12 2007 → Dec 14 2007

Other

Other	2007 International Semiconductor Device Research Symposium, ISDRS
Country/Territory	United States
City	College Park, MD
Period	12/12/07 → 12/14/07

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

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10.1109/ISDRS.2007.4422500

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Jurchescu, O. D., Hamadani, B. H., Xiong, H., Park, S. K., Subramanian, S., Zimmerman, N. M., Anthony, J., Jackson, T. N., & Gundlach, D. J. (2007). Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors. In 2007 International Semiconductor Device Research Symposium, ISDRS [4422500] https://doi.org/10.1109/ISDRS.2007.4422500

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title = "Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors",

author = "Jurchescu, {Oana D.} and Hamadani, {Behrang H.} and Hao Xiong and Park, {Sungkyu K.} and Sankar Subramanian and Zimmerman, {Neil M.} and John Anthony and Jackson, {Thomas Nelson} and Gundlach, {David J.}",

year = "2007",

month = dec,

day = "1",

doi = "10.1109/ISDRS.2007.4422500",

language = "English (US)",

isbn = "1424418917",

booktitle = "2007 International Semiconductor Device Research Symposium, ISDRS",

note = "2007 International Semiconductor Device Research Symposium, ISDRS ; Conference date: 12-12-2007 Through 14-12-2007",

}

Jurchescu, OD, Hamadani, BH, Xiong, H, Park, SK, Subramanian, S, Zimmerman, NM, Anthony, J, Jackson, TN & Gundlach, DJ 2007, Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors. in 2007 International Semiconductor Device Research Symposium, ISDRS., 4422500, 2007 International Semiconductor Device Research Symposium, ISDRS, College Park, MD, United States, 12/12/07. https://doi.org/10.1109/ISDRS.2007.4422500

TY - GEN

T1 - Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

AU - Jurchescu, Oana D.

AU - Hamadani, Behrang H.

AU - Xiong, Hao

AU - Park, Sungkyu K.

AU - Subramanian, Sankar

AU - Zimmerman, Neil M.

AU - Anthony, John

AU - Jackson, Thomas Nelson

AU - Gundlach, David J.

PY - 2007/12/1

Y1 - 2007/12/1

UR - http://www.scopus.com/inward/record.url?scp=44949186582&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=44949186582&partnerID=8YFLogxK

U2 - 10.1109/ISDRS.2007.4422500

DO - 10.1109/ISDRS.2007.4422500

M3 - Conference contribution

AN - SCOPUS:44949186582

SN - 1424418917

SN - 9781424418916

BT - 2007 International Semiconductor Device Research Symposium, ISDRS

T2 - 2007 International Semiconductor Device Research Symposium, ISDRS

Y2 - 12 December 2007 through 14 December 2007

ER -

Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

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All Science Journal Classification (ASJC) codes

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