Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

Oana D. Jurchescu; Behrang H. Hamadani; Hao Xiong; Sungkyu K. Park; Sankar Subramanian; Neil M. Zimmerman; John Anthony; Thomas Nelson Jackson; David J. Gundlach

doi:10.1109/ISDRS.2007.4422500

Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

Oana D. Jurchescu, Behrang H. Hamadani, Hao Xiong, Sungkyu K. Park, Sankar Subramanian, Neil M. Zimmerman, John Anthony, Thomas Nelson Jackson, David J. Gundlach

Materials Research Institute (MRI)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	2007 International Semiconductor Device Research Symposium, ISDRS
DOIs	https://doi.org/10.1109/ISDRS.2007.4422500
State	Published - Dec 1 2007
Event	2007 International Semiconductor Device Research Symposium, ISDRS - College Park, MD, United States Duration: Dec 12 2007 → Dec 14 2007

Other

Other	2007 International Semiconductor Device Research Symposium, ISDRS
Country	United States
City	College Park, MD
Period	12/12/07 → 12/14/07

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/ISDRS.2007.4422500

Cite this

Jurchescu, O. D., Hamadani, B. H., Xiong, H., Park, S. K., Subramanian, S., Zimmerman, N. M., Anthony, J., Jackson, T. N., & Gundlach, D. J. (2007). Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors. In 2007 International Semiconductor Device Research Symposium, ISDRS [4422500] https://doi.org/10.1109/ISDRS.2007.4422500

Jurchescu, Oana D. ; Hamadani, Behrang H. ; Xiong, Hao ; Park, Sungkyu K. ; Subramanian, Sankar ; Zimmerman, Neil M. ; Anthony, John ; Jackson, Thomas Nelson ; Gundlach, David J. / Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors. 2007 International Semiconductor Device Research Symposium, ISDRS. 2007.

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title = "Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors",

author = "Jurchescu, {Oana D.} and Hamadani, {Behrang H.} and Hao Xiong and Park, {Sungkyu K.} and Sankar Subramanian and Zimmerman, {Neil M.} and John Anthony and Jackson, {Thomas Nelson} and Gundlach, {David J.}",

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doi = "10.1109/ISDRS.2007.4422500",

language = "English (US)",

isbn = "1424418917",

booktitle = "2007 International Semiconductor Device Research Symposium, ISDRS",

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Jurchescu, OD, Hamadani, BH, Xiong, H, Park, SK, Subramanian, S, Zimmerman, NM, Anthony, J, Jackson, TN & Gundlach, DJ 2007, Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors. in 2007 International Semiconductor Device Research Symposium, ISDRS., 4422500, 2007 International Semiconductor Device Research Symposium, ISDRS, College Park, MD, United States, 12/12/07. https://doi.org/10.1109/ISDRS.2007.4422500

Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors. / Jurchescu, Oana D.; Hamadani, Behrang H.; Xiong, Hao; Park, Sungkyu K.; Subramanian, Sankar; Zimmerman, Neil M.; Anthony, John; Jackson, Thomas Nelson; Gundlach, David J.

2007 International Semiconductor Device Research Symposium, ISDRS. 2007. 4422500.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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T1 - Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

AU - Jurchescu, Oana D.

AU - Hamadani, Behrang H.

AU - Xiong, Hao

AU - Park, Sungkyu K.

AU - Subramanian, Sankar

AU - Zimmerman, Neil M.

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AU - Jackson, Thomas Nelson

AU - Gundlach, David J.

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DO - 10.1109/ISDRS.2007.4422500

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BT - 2007 International Semiconductor Device Research Symposium, ISDRS

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