Interferometric hard x-ray phase contrast imaging at 204 nm grating period

Han Wen, Douglas E. Wolfe, Andrew A. Gomella, Houxun Miao, Xianghui Xiao, Chian Liu, Susanna K. Lynch, Nicole Morgan

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We report on hard x-ray phase contrast imaging experiments using a grating interferometer of approximately 1/10th the grating period achieved in previous studies. We designed the gratings as a staircase array of multilayer stacks which are fabricated in a single thin film deposition process. We performed the experiments at 19 keV x-ray energy and 0.8 μm pixel resolution. The small grating period resulted in clear separation of different diffraction orders and multiple images on the detector. A slitted beam was used to remove overlap of the images from the different diffraction orders. The phase contrast images showed detailed features as small as 10 μm, and demonstrated the feasibility of high resolution x-ray phase contrast imaging with nanometer scale gratings.

Original languageEnglish (US)
Article number013706
JournalReview of Scientific Instruments
Volume84
Issue number1
DOIs
StatePublished - Jan 1 2013

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phase contrast
gratings
Imaging techniques
X rays
Diffraction
x rays
Diffraction gratings
Interferometers
Multilayers
Pixels
Experiments
stairways
Detectors
Thin films
diffraction
interferometers
pixels
high resolution
detectors
thin films

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Wen, Han ; Wolfe, Douglas E. ; Gomella, Andrew A. ; Miao, Houxun ; Xiao, Xianghui ; Liu, Chian ; Lynch, Susanna K. ; Morgan, Nicole. / Interferometric hard x-ray phase contrast imaging at 204 nm grating period. In: Review of Scientific Instruments. 2013 ; Vol. 84, No. 1.
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Wen, H, Wolfe, DE, Gomella, AA, Miao, H, Xiao, X, Liu, C, Lynch, SK & Morgan, N 2013, 'Interferometric hard x-ray phase contrast imaging at 204 nm grating period', Review of Scientific Instruments, vol. 84, no. 1, 013706. https://doi.org/10.1063/1.4788910

Interferometric hard x-ray phase contrast imaging at 204 nm grating period. / Wen, Han; Wolfe, Douglas E.; Gomella, Andrew A.; Miao, Houxun; Xiao, Xianghui; Liu, Chian; Lynch, Susanna K.; Morgan, Nicole.

In: Review of Scientific Instruments, Vol. 84, No. 1, 013706, 01.01.2013.

Research output: Contribution to journalArticle

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