Internal field in lithium tantalate single crystals

Venkatraman Gopalan, Mool C. Gupta

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An in-built internal field of 5 KV/mm was measured in Z-cut LiTaO 3 single crystals in the direction of the original polarization. This was reflected in the asymmetry (along the field axis) in the polarization hysteresis curve as a function of external electric field. Measurement of internal field as a function of crystal thickness revealed that the internal field is a volume effect. Using infrared absorption measurements, the spectrum of the hydroxyl ions (OH -) present in these crystals was measured at room temperature. The shape of the spectrum changes with polarization reversal in these crystals indicating a strong correlation with the direction of internal field with respect to the polarization direction. It suggests that the origin of internal field lies in point defect complexes involving OH - ions.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsMool C. Gupta, William J. Kozlovsky, David C. MacPherson
Pages28-33
Number of pages6
StatePublished - Jan 1 1996
EventNonlinear Frequency Generation and Conversion - San Jose, CA, USA
Duration: Jan 29 1996Jan 31 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2700

Other

OtherNonlinear Frequency Generation and Conversion
CitySan Jose, CA, USA
Period1/29/961/31/96

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Gopalan, V., & Gupta, M. C. (1996). Internal field in lithium tantalate single crystals. In M. C. Gupta, W. J. Kozlovsky, & D. C. MacPherson (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 28-33). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2700).