Intrinsic luminance loss in phosphorescent small-molecule organic light emitting devices due to bimolecular annihilation reactions

Noel Christopher Giebink, B. W. D'Andrade, M. S. Weaver, P. B. MacKenzie, J. J. Brown, M. E. Thompson, S. R. Forrest

Research output: Contribution to journalArticle

163 Citations (Scopus)

Abstract

Operational degradation of blue electrophosphorescent organic light emitting devices (OLEDs) is studied by examining the luminance loss, voltage rise, and emissive layer photoluminescence quenching that occur in electrically aged devices. Using a model where defect sites act as deep charge traps, nonradiative recombination centers, and luminescence quenchers, we show that the luminance loss and voltage rise dependence on time and current density are consistent with defect formation due primarily to exciton-polaron annihilation reactions. Defect densities ∼ 1018 cm-3 result in >50% luminance loss. Implications for the design of electrophosphorescent OLEDs with improved lifetime are discussed.

Original languageEnglish (US)
Article number044509
JournalJournal of Applied Physics
Volume103
Issue number4
DOIs
StatePublished - Mar 7 2008

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annihilation reactions
luminance
defects
molecules
electric potential
quenching
excitons
traps
luminescence
current density
degradation
photoluminescence
life (durability)

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

Cite this

Giebink, Noel Christopher ; D'Andrade, B. W. ; Weaver, M. S. ; MacKenzie, P. B. ; Brown, J. J. ; Thompson, M. E. ; Forrest, S. R. / Intrinsic luminance loss in phosphorescent small-molecule organic light emitting devices due to bimolecular annihilation reactions. In: Journal of Applied Physics. 2008 ; Vol. 103, No. 4.
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Intrinsic luminance loss in phosphorescent small-molecule organic light emitting devices due to bimolecular annihilation reactions. / Giebink, Noel Christopher; D'Andrade, B. W.; Weaver, M. S.; MacKenzie, P. B.; Brown, J. J.; Thompson, M. E.; Forrest, S. R.

In: Journal of Applied Physics, Vol. 103, No. 4, 044509, 07.03.2008.

Research output: Contribution to journalArticle

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AU - D'Andrade, B. W.

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AB - Operational degradation of blue electrophosphorescent organic light emitting devices (OLEDs) is studied by examining the luminance loss, voltage rise, and emissive layer photoluminescence quenching that occur in electrically aged devices. Using a model where defect sites act as deep charge traps, nonradiative recombination centers, and luminescence quenchers, we show that the luminance loss and voltage rise dependence on time and current density are consistent with defect formation due primarily to exciton-polaron annihilation reactions. Defect densities ∼ 1018 cm-3 result in >50% luminance loss. Implications for the design of electrophosphorescent OLEDs with improved lifetime are discussed.

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