| Original language | English (US) |
|---|---|
| Article number | 5062531 |
| Pages (from-to) | 104-105 |
| Number of pages | 2 |
| Journal | IEEE Transactions on Device and Materials Reliability |
| Volume | 9 |
| Issue number | 2 |
| DOIs | |
| State | Published - Jun 1 2009 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Safety, Risk, Reliability and Quality
- Electrical and Electronic Engineering
Cite this
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Introduction to the special issue on 2008 international integrated reliability workshop (IIRW). / Tao, Guoqiao; Lenahan, Patrick; Haase, Gaddi; Young, Chadwin; Strong, Alvin.
In: IEEE Transactions on Device and Materials Reliability, Vol. 9, No. 2, 5062531, 01.06.2009, p. 104-105.Research output: Contribution to journal › Editorial
TY - JOUR
T1 - Introduction to the special issue on 2008 international integrated reliability workshop (IIRW)
AU - Tao, Guoqiao
AU - Lenahan, Patrick
AU - Haase, Gaddi
AU - Young, Chadwin
AU - Strong, Alvin
PY - 2009/6/1
Y1 - 2009/6/1
UR - http://www.scopus.com/inward/record.url?scp=67650327358&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=67650327358&partnerID=8YFLogxK
U2 - 10.1109/TDMR.2009.2020526
DO - 10.1109/TDMR.2009.2020526
M3 - Editorial
AN - SCOPUS:67650327358
VL - 9
SP - 104
EP - 105
JO - IEEE Transactions on Device and Materials Reliability
JF - IEEE Transactions on Device and Materials Reliability
SN - 1530-4388
IS - 2
M1 - 5062531
ER -