Introduction to the special issue on 2008 international integrated reliability workshop (IIRW)

Guoqiao Tao, Patrick Lenahan, Gaddi Haase, Chadwin Young, Alvin Strong

Research output: Contribution to journalEditorialpeer-review

Original languageEnglish (US)
Article number5062531
Pages (from-to)104-105
Number of pages2
JournalIEEE Transactions on Device and Materials Reliability
Volume9
Issue number2
DOIs
StatePublished - Jun 1 2009

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

Cite this