Introduction to the special issue on 2008 international integrated reliability workshop (IIRW)

Guoqiao Tao, Patrick Lenahan, Gaddi Haase, Chadwin Young, Alvin Strong

Research output: Contribution to journalEditorial

Original languageEnglish (US)
Article number5062531
Pages (from-to)104-105
Number of pages2
JournalIEEE Transactions on Device and Materials Reliability
Volume9
Issue number2
DOIs
StatePublished - Jun 1 2009

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

Cite this

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title = "Introduction to the special issue on 2008 international integrated reliability workshop (IIRW)",
author = "Guoqiao Tao and Patrick Lenahan and Gaddi Haase and Chadwin Young and Alvin Strong",
year = "2009",
month = "6",
day = "1",
doi = "10.1109/TDMR.2009.2020526",
language = "English (US)",
volume = "9",
pages = "104--105",
journal = "IEEE Transactions on Device and Materials Reliability",
issn = "1530-4388",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "2",

}

Introduction to the special issue on 2008 international integrated reliability workshop (IIRW). / Tao, Guoqiao; Lenahan, Patrick; Haase, Gaddi; Young, Chadwin; Strong, Alvin.

In: IEEE Transactions on Device and Materials Reliability, Vol. 9, No. 2, 5062531, 01.06.2009, p. 104-105.

Research output: Contribution to journalEditorial

TY - JOUR

T1 - Introduction to the special issue on 2008 international integrated reliability workshop (IIRW)

AU - Tao, Guoqiao

AU - Lenahan, Patrick

AU - Haase, Gaddi

AU - Young, Chadwin

AU - Strong, Alvin

PY - 2009/6/1

Y1 - 2009/6/1

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U2 - 10.1109/TDMR.2009.2020526

DO - 10.1109/TDMR.2009.2020526

M3 - Editorial

AN - SCOPUS:67650327358

VL - 9

SP - 104

EP - 105

JO - IEEE Transactions on Device and Materials Reliability

JF - IEEE Transactions on Device and Materials Reliability

SN - 1530-4388

IS - 2

M1 - 5062531

ER -