Introduction to the special issue on high-k dielectric reliability

John F. Conley, Gennadi Bersuker, Patrick M. Lenahan

Research output: Contribution to journalEditorialpeer-review

Original languageEnglish (US)
Pages (from-to)3-4
Number of pages2
JournalIEEE Transactions on Device and Materials Reliability
Volume5
Issue number1
DOIs
StatePublished - Mar 1 2005

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

Cite this