Introduction to the special issue on high-k dielectric reliability

John F. Conley, Gennadi Bersuker, Patrick M. Lenahan

Research output: Contribution to journalEditorial

Original languageEnglish (US)
Pages (from-to)3-4
Number of pages2
JournalIEEE Transactions on Device and Materials Reliability
Volume5
Issue number1
DOIs
StatePublished - Mar 1 2005

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High-k dielectric

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

Cite this

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title = "Introduction to the special issue on high-k dielectric reliability",
author = "Conley, {John F.} and Gennadi Bersuker and Lenahan, {Patrick M.}",
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pages = "3--4",
journal = "IEEE Transactions on Device and Materials Reliability",
issn = "1530-4388",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
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}

Introduction to the special issue on high-k dielectric reliability. / Conley, John F.; Bersuker, Gennadi; Lenahan, Patrick M.

In: IEEE Transactions on Device and Materials Reliability, Vol. 5, No. 1, 01.03.2005, p. 3-4.

Research output: Contribution to journalEditorial

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