| Original language | English (US) |
|---|---|
| Pages (from-to) | 3-4 |
| Number of pages | 2 |
| Journal | IEEE Transactions on Device and Materials Reliability |
| Volume | 5 |
| Issue number | 1 |
| DOIs | |
| State | Published - Mar 1 2005 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Safety, Risk, Reliability and Quality
- Electrical and Electronic Engineering
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Introduction to the special issue on high-k dielectric reliability. / Conley, John F.; Bersuker, Gennadi; Lenahan, Patrick M.
In: IEEE Transactions on Device and Materials Reliability, Vol. 5, No. 1, 01.03.2005, p. 3-4.Research output: Contribution to journal › Editorial
TY - JOUR
T1 - Introduction to the special issue on high-k dielectric reliability
AU - Conley, John F.
AU - Bersuker, Gennadi
AU - Lenahan, Patrick M.
PY - 2005/3/1
Y1 - 2005/3/1
UR - http://www.scopus.com/inward/record.url?scp=20444504775&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=20444504775&partnerID=8YFLogxK
U2 - 10.1109/TDMR.2005.847999
DO - 10.1109/TDMR.2005.847999
M3 - Editorial
AN - SCOPUS:20444504775
VL - 5
SP - 3
EP - 4
JO - IEEE Transactions on Device and Materials Reliability
JF - IEEE Transactions on Device and Materials Reliability
SN - 1530-4388
IS - 1
ER -