Introduction to the special issue on the 2007 international integrated reliability workshop

Patrick M. Lenahan, Bill Knowlton, John F. Conley, Bill Tonti, John Suehle, Tibor Grasser

Research output: Contribution to journalEditorial

Original languageEnglish (US)
Article number4655592
Number of pages1
JournalIEEE Transactions on Device and Materials Reliability
Volume8
Issue number3
DOIs
StatePublished - Sep 1 2008

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

Cite this

Lenahan, Patrick M. ; Knowlton, Bill ; Conley, John F. ; Tonti, Bill ; Suehle, John ; Grasser, Tibor. / Introduction to the special issue on the 2007 international integrated reliability workshop. In: IEEE Transactions on Device and Materials Reliability. 2008 ; Vol. 8, No. 3.
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Introduction to the special issue on the 2007 international integrated reliability workshop. / Lenahan, Patrick M.; Knowlton, Bill; Conley, John F.; Tonti, Bill; Suehle, John; Grasser, Tibor.

In: IEEE Transactions on Device and Materials Reliability, Vol. 8, No. 3, 4655592, 01.09.2008.

Research output: Contribution to journalEditorial

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AU - Grasser, Tibor

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JO - IEEE Transactions on Device and Materials Reliability

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