Introduction to the special issue on the 2007 international integrated reliability workshop

Patrick M. Lenahan, Bill Knowlton, John F. Conley, Bill Tonti, John Suehle, Tibor Grasser

Research output: Contribution to journalEditorial

Original languageEnglish (US)
Article number4655592
Number of pages1
JournalIEEE Transactions on Device and Materials Reliability
Volume8
Issue number3
DOIs
StatePublished - Sep 1 2008

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

Cite this