Investigation of the oxidation of polycrystalline lead by XPS and SIMS

R. W. Hewitt, Nicholas Winograd

Research output: Contribution to journalArticle

37 Citations (Scopus)

Abstract

The oxidation of clean polycrystalline lead surfaces has been investigated by the static mode of secondary ion mass spectrometry and X-ray photoelectron spectroscopy. The XPS Pb(4f 7 2) and O(1s) peaks indicate the immediate formation of the rhombic (yellow) form of PbO upon oxygen exposure, with no evidnece for an intermediate adsorbed oxygen moiety. Positive and negative ion static SIMS spectra were recorded in conjunction with the photoemission experiments, and the quantitative coverage information of XPS is used as an aid in the interpretation of the SIMS data. The O+, O2+, Pb+, PbO+, O-, O2-, PbO-, and PbO2- secondary ions were observed during the course of the oxidation, although the positive ion yields were too low to offer detailed information. Recent theoretical predictions of the cluster formation mechanism require considerable local atomic order of the surface to be maintained in the cluster. We therefore explain the immediate appearance of O2- and PbO2- clusters by invoking a nucleation mechanism for growth of the oxide.

Original languageEnglish (US)
Pages (from-to)1-14
Number of pages14
JournalSurface Science
Volume78
Issue number1
DOIs
StatePublished - Nov 1 1978

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Secondary ion mass spectrometry
secondary ion mass spectrometry
X ray photoelectron spectroscopy
Lead
positive ions
Oxidation
oxidation
Positive ions
Oxygen
Photoemission
oxygen
negative ions
Oxides
Nucleation
Negative ions
photoelectric emission
photoelectron spectroscopy
nucleation
Ions
oxides

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

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abstract = "The oxidation of clean polycrystalline lead surfaces has been investigated by the static mode of secondary ion mass spectrometry and X-ray photoelectron spectroscopy. The XPS Pb(4f 7 2) and O(1s) peaks indicate the immediate formation of the rhombic (yellow) form of PbO upon oxygen exposure, with no evidnece for an intermediate adsorbed oxygen moiety. Positive and negative ion static SIMS spectra were recorded in conjunction with the photoemission experiments, and the quantitative coverage information of XPS is used as an aid in the interpretation of the SIMS data. The O+, O2+, Pb+, PbO+, O-, O2-, PbO-, and PbO2- secondary ions were observed during the course of the oxidation, although the positive ion yields were too low to offer detailed information. Recent theoretical predictions of the cluster formation mechanism require considerable local atomic order of the surface to be maintained in the cluster. We therefore explain the immediate appearance of O2- and PbO2- clusters by invoking a nucleation mechanism for growth of the oxide.",
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Investigation of the oxidation of polycrystalline lead by XPS and SIMS. / Hewitt, R. W.; Winograd, Nicholas.

In: Surface Science, Vol. 78, No. 1, 01.11.1978, p. 1-14.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Investigation of the oxidation of polycrystalline lead by XPS and SIMS

AU - Hewitt, R. W.

AU - Winograd, Nicholas

PY - 1978/11/1

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N2 - The oxidation of clean polycrystalline lead surfaces has been investigated by the static mode of secondary ion mass spectrometry and X-ray photoelectron spectroscopy. The XPS Pb(4f 7 2) and O(1s) peaks indicate the immediate formation of the rhombic (yellow) form of PbO upon oxygen exposure, with no evidnece for an intermediate adsorbed oxygen moiety. Positive and negative ion static SIMS spectra were recorded in conjunction with the photoemission experiments, and the quantitative coverage information of XPS is used as an aid in the interpretation of the SIMS data. The O+, O2+, Pb+, PbO+, O-, O2-, PbO-, and PbO2- secondary ions were observed during the course of the oxidation, although the positive ion yields were too low to offer detailed information. Recent theoretical predictions of the cluster formation mechanism require considerable local atomic order of the surface to be maintained in the cluster. We therefore explain the immediate appearance of O2- and PbO2- clusters by invoking a nucleation mechanism for growth of the oxide.

AB - The oxidation of clean polycrystalline lead surfaces has been investigated by the static mode of secondary ion mass spectrometry and X-ray photoelectron spectroscopy. The XPS Pb(4f 7 2) and O(1s) peaks indicate the immediate formation of the rhombic (yellow) form of PbO upon oxygen exposure, with no evidnece for an intermediate adsorbed oxygen moiety. Positive and negative ion static SIMS spectra were recorded in conjunction with the photoemission experiments, and the quantitative coverage information of XPS is used as an aid in the interpretation of the SIMS data. The O+, O2+, Pb+, PbO+, O-, O2-, PbO-, and PbO2- secondary ions were observed during the course of the oxidation, although the positive ion yields were too low to offer detailed information. Recent theoretical predictions of the cluster formation mechanism require considerable local atomic order of the surface to be maintained in the cluster. We therefore explain the immediate appearance of O2- and PbO2- clusters by invoking a nucleation mechanism for growth of the oxide.

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