Investigation on optical properties of Bi2.85La 0.15TiNbO9 thin films by prism coupling technique

Mingfu Zhang, Hengzhi Chen, Bin Yang, Wenwu Cao

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Layered-perovskite ferroelectric Bi2.85La0.15TiNbO 9 (LBTN) optical waveguiding thin films were grown on fused silica substrates by pulsed laser deposition (PLD). X-ray diffraction (XRD) revealed that the film is highly (00l) textured. We observed sharp and distinct transverse electric (TE) and transverse magnetic (TM) multimodes and measured the refractive indices of LBTN thin films at 632.8 nm. The ordinary and extraordinary refractive indices were calculated to be n TE=2.358 and n TM=2.464, respectively. The film homogeneity and the film-substrate interface were analyzed using an improved version of the inverse Wentzel-Kramer-Brillouin (iWKB) method. The refractive index of the film remains constant at n 0 within the waveguiding layer. The average transmittance of the film is 70% in the wavelength range of 400-1400 nm and the optical waveguiding properties were evaluated by the optical prism coupling method. Our results showed that the LBTN films are very good electro-optical active material.

Original languageEnglish (US)
Pages (from-to)741-744
Number of pages4
JournalApplied Physics A: Materials Science and Processing
Volume97
Issue number4
DOIs
StatePublished - Dec 1 2009

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Prisms
Optical properties
Thin films
Perovskite
Ferroelectric materials
Refractive index
Optical films
Substrates
Fused silica
Pulsed laser deposition
X ray diffraction
Wavelength
perovskite

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Materials Science(all)

Cite this

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abstract = "Layered-perovskite ferroelectric Bi2.85La0.15TiNbO 9 (LBTN) optical waveguiding thin films were grown on fused silica substrates by pulsed laser deposition (PLD). X-ray diffraction (XRD) revealed that the film is highly (00l) textured. We observed sharp and distinct transverse electric (TE) and transverse magnetic (TM) multimodes and measured the refractive indices of LBTN thin films at 632.8 nm. The ordinary and extraordinary refractive indices were calculated to be n TE=2.358 and n TM=2.464, respectively. The film homogeneity and the film-substrate interface were analyzed using an improved version of the inverse Wentzel-Kramer-Brillouin (iWKB) method. The refractive index of the film remains constant at n 0 within the waveguiding layer. The average transmittance of the film is 70{\%} in the wavelength range of 400-1400 nm and the optical waveguiding properties were evaluated by the optical prism coupling method. Our results showed that the LBTN films are very good electro-optical active material.",
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Investigation on optical properties of Bi2.85La 0.15TiNbO9 thin films by prism coupling technique. / Zhang, Mingfu; Chen, Hengzhi; Yang, Bin; Cao, Wenwu.

In: Applied Physics A: Materials Science and Processing, Vol. 97, No. 4, 01.12.2009, p. 741-744.

Research output: Contribution to journalArticle

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