Abstract
In this study, the feasibility of molecular depth profiling using dual beam sputtering of biological materials is examined. The model system is a 402-nm Langmuir Blodgett multilayer film consisting of 149 monolayers of barium arachidate (AA). The thin film was initially subjected to pre-bombardment with a 15-keV Au+ beam. Subsequently, an imaging depth profile experiment was performed on the pre-irradiated sample using a 40-keV C60 + beam. An extremely low erosion rate under Au+ bombardment is found on this model system. In the subsequent C60 + depth profiles, surprisingly large molecular ion signals are detected at the gold pre-irradiated surface. These signals then rapidly decay to nearly zero, indicating a damaged sub-surface layer being generated by the Au+ pre-bombardment. The thickness of the damaged layer is found to increase with increasing gold ion fluence and saturate at about 100 nm at 6 × 1014 Au+/cm2. This altered layer thickness is significantly larger than the value of ∼50 nm obtained on a trehalose film pre-bombarded with a Ga+ source. The results also show that the damage caused by the Au+ beam can be removed by C 60+ sputtering and that the molecular information is restored after damage removal.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 175-177 |
| Number of pages | 3 |
| Journal | Surface and Interface Analysis |
| Volume | 45 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 1 2013 |
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All Science Journal Classification (ASJC) codes
- Chemistry(all)
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry
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Investigations of molecular depth profiling with dual beam sputtering. / Lu, C.; Wucher, A.; Winograd, Nicholas.
In: Surface and Interface Analysis, Vol. 45, No. 1, 01.01.2013, p. 175-177.Research output: Contribution to journal › Article
TY - JOUR
T1 - Investigations of molecular depth profiling with dual beam sputtering
AU - Lu, C.
AU - Wucher, A.
AU - Winograd, Nicholas
PY - 2013/1/1
Y1 - 2013/1/1
N2 - In this study, the feasibility of molecular depth profiling using dual beam sputtering of biological materials is examined. The model system is a 402-nm Langmuir Blodgett multilayer film consisting of 149 monolayers of barium arachidate (AA). The thin film was initially subjected to pre-bombardment with a 15-keV Au+ beam. Subsequently, an imaging depth profile experiment was performed on the pre-irradiated sample using a 40-keV C60 + beam. An extremely low erosion rate under Au+ bombardment is found on this model system. In the subsequent C60 + depth profiles, surprisingly large molecular ion signals are detected at the gold pre-irradiated surface. These signals then rapidly decay to nearly zero, indicating a damaged sub-surface layer being generated by the Au+ pre-bombardment. The thickness of the damaged layer is found to increase with increasing gold ion fluence and saturate at about 100 nm at 6 × 1014 Au+/cm2. This altered layer thickness is significantly larger than the value of ∼50 nm obtained on a trehalose film pre-bombarded with a Ga+ source. The results also show that the damage caused by the Au+ beam can be removed by C 60+ sputtering and that the molecular information is restored after damage removal.
AB - In this study, the feasibility of molecular depth profiling using dual beam sputtering of biological materials is examined. The model system is a 402-nm Langmuir Blodgett multilayer film consisting of 149 monolayers of barium arachidate (AA). The thin film was initially subjected to pre-bombardment with a 15-keV Au+ beam. Subsequently, an imaging depth profile experiment was performed on the pre-irradiated sample using a 40-keV C60 + beam. An extremely low erosion rate under Au+ bombardment is found on this model system. In the subsequent C60 + depth profiles, surprisingly large molecular ion signals are detected at the gold pre-irradiated surface. These signals then rapidly decay to nearly zero, indicating a damaged sub-surface layer being generated by the Au+ pre-bombardment. The thickness of the damaged layer is found to increase with increasing gold ion fluence and saturate at about 100 nm at 6 × 1014 Au+/cm2. This altered layer thickness is significantly larger than the value of ∼50 nm obtained on a trehalose film pre-bombarded with a Ga+ source. The results also show that the damage caused by the Au+ beam can be removed by C 60+ sputtering and that the molecular information is restored after damage removal.
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U2 - 10.1002/sia.4838
DO - 10.1002/sia.4838
M3 - Article
AN - SCOPUS:84872850988
VL - 45
SP - 175
EP - 177
JO - Surface and Interface Analysis
JF - Surface and Interface Analysis
SN - 0142-2421
IS - 1
ER -