Investigations of molecular depth profiling with dual beam sputtering

C. Lu, A. Wucher, Nicholas Winograd

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

In this study, the feasibility of molecular depth profiling using dual beam sputtering of biological materials is examined. The model system is a 402-nm Langmuir Blodgett multilayer film consisting of 149 monolayers of barium arachidate (AA). The thin film was initially subjected to pre-bombardment with a 15-keV Au+ beam. Subsequently, an imaging depth profile experiment was performed on the pre-irradiated sample using a 40-keV C60 + beam. An extremely low erosion rate under Au+ bombardment is found on this model system. In the subsequent C60 + depth profiles, surprisingly large molecular ion signals are detected at the gold pre-irradiated surface. These signals then rapidly decay to nearly zero, indicating a damaged sub-surface layer being generated by the Au+ pre-bombardment. The thickness of the damaged layer is found to increase with increasing gold ion fluence and saturate at about 100 nm at 6 × 1014 Au+/cm2. This altered layer thickness is significantly larger than the value of ∼50 nm obtained on a trehalose film pre-bombarded with a Ga+ source. The results also show that the damage caused by the Au+ beam can be removed by C 60+ sputtering and that the molecular information is restored after damage removal.

Original languageEnglish (US)
Pages (from-to)175-177
Number of pages3
JournalSurface and Interface Analysis
Volume45
Issue number1
DOIs
StatePublished - Jan 1 2013

Fingerprint

Depth profiling
Gold
Sputtering
sputtering
Ions
bombardment
Trehalose
Multilayer films
Barium
Biological materials
Erosion
Monolayers
gold
damage
Imaging techniques
Thin films
profiles
molecular ions
erosion
barium

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

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Investigations of molecular depth profiling with dual beam sputtering. / Lu, C.; Wucher, A.; Winograd, Nicholas.

In: Surface and Interface Analysis, Vol. 45, No. 1, 01.01.2013, p. 175-177.

Research output: Contribution to journalArticle

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