TY - JOUR
T1 - Ion beam induced desorption with postionization using high repetition femtosecond lasers
AU - Brummel, C. L.
AU - Willey, K. F.
AU - Vickerman, J. C.
AU - Winograd, N.
N1 - Funding Information:
The authors appreciate the encouragement of Philippe Bado of Clark-MXR. Partial financial support from the Department of Energy, National Institute of Health, National Science Foundation and Office of Naval Research is also appreciated. The laser system was purchased using a University Research Initiative Grant from the Department of Energy.
PY - 1995/5/25
Y1 - 1995/5/25
N2 - Static SIMS has shown itself to be a powerful tool for surface analysis with high chemical specificity. Because of the destructive nature of the sputtering process, high spatial resolution analysis (sub-200-nm regime) requires very high yields of emitted ions since there is a very limited amount of material in each image pixel. Generally the sputtered neutral yield is significantly greater than the secondary ion yield. To attain the high sensitivities required it is therefore critical that the ejected neutrals be ionized efficiently with minimal fragmentation. This paper explores the application of a high repetition rate Ti:sapphire based femtosecond laser to the ionization of sputtered and gas phase species from a variety of representative materials including silver, indium, tryptophan, benzo[a]pyrene, p-nitroaniline and polystyrene. The effects of photon wavelength (800, 400, and 266 nm) and power density on ionization and molecular fragmentation have been studied.
AB - Static SIMS has shown itself to be a powerful tool for surface analysis with high chemical specificity. Because of the destructive nature of the sputtering process, high spatial resolution analysis (sub-200-nm regime) requires very high yields of emitted ions since there is a very limited amount of material in each image pixel. Generally the sputtered neutral yield is significantly greater than the secondary ion yield. To attain the high sensitivities required it is therefore critical that the ejected neutrals be ionized efficiently with minimal fragmentation. This paper explores the application of a high repetition rate Ti:sapphire based femtosecond laser to the ionization of sputtered and gas phase species from a variety of representative materials including silver, indium, tryptophan, benzo[a]pyrene, p-nitroaniline and polystyrene. The effects of photon wavelength (800, 400, and 266 nm) and power density on ionization and molecular fragmentation have been studied.
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U2 - 10.1016/0168-1176(94)04121-M
DO - 10.1016/0168-1176(94)04121-M
M3 - Article
AN - SCOPUS:11544264427
SN - 1387-3806
VL - 143
SP - 257
EP - 270
JO - International Journal of Mass Spectrometry and Ion Processes
JF - International Journal of Mass Spectrometry and Ion Processes
IS - C
ER -