Ion-induced erosion of organic self-assembled monolayers

P. Cyganik, Z. Postawa, C. A. Meserole, E. Vandeweert, Nicholas Winograd

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Laser post-ionization mass spectrometry combined with Scanning Tunneling Microscopy (STM) has been used to investigate processes of ion-stimulated erosion of self-assembled monolayers (SAM) of phenethyl mercaptan C6H5CH2CH2S (PEM) deposited on gold. Results indicate that only PEM fragments are emitted from the surface. Most of the PEM fragments (predominantly C6H5CH2CH3 with m/z= 106) are emitted with thermal kinetic energies. STM images collected on 8 keV H2 +-irradiated surfaces with a system tuned to probe electronic states of sulfur atoms show no additional damage induced by irradiation. This indicates that sulfur atoms are not removed from the surface during hydrogen bombardment. It is proposed that the emission of SAM molecules is initiated by chemical reactions which gently break C-S bonds.

Original languageEnglish (US)
Pages (from-to)137-142
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume148
Issue number1-4
DOIs
StatePublished - Jan 1 1999

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Self assembled monolayers
thiols
erosion
Erosion
Scanning tunneling microscopy
scanning tunneling microscopy
Ions
sulfur
Sulfur
fragments
Atoms
ions
Electronic states
Kinetic energy
Ionization
Mass spectrometry
atoms
bombardment
Chemical reactions
chemical reactions

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

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Ion-induced erosion of organic self-assembled monolayers. / Cyganik, P.; Postawa, Z.; Meserole, C. A.; Vandeweert, E.; Winograd, Nicholas.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 148, No. 1-4, 01.01.1999, p. 137-142.

Research output: Contribution to journalArticle

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AU - Cyganik, P.

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