IoT metrology

Jeffrey Voas, Rick Kuhn, Phillip A. Laplante

Research output: Contribution to journalReview article

Abstract

In the Internet of Things (IoT), what can we measure? The authors explore how the field of metrology might be applicable to the IoT.

Original languageEnglish (US)
Pages (from-to)6-10
Number of pages5
JournalIT Professional
Volume20
Issue number3
DOIs
StatePublished - May 1 2018

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Science Applications

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