IoT metrology

Jeffrey Voas, Rick Kuhn, Phillip A. Laplante

Research output: Contribution to journalReview article

Abstract

In the Internet of Things (IoT), what can we measure? The authors explore how the field of metrology might be applicable to the IoT.

Original languageEnglish (US)
Pages (from-to)6-10
Number of pages5
JournalIT Professional
Volume20
Issue number3
DOIs
StatePublished - May 1 2018

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Internet of things

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Science Applications

Cite this

Voas, Jeffrey ; Kuhn, Rick ; Laplante, Phillip A. / IoT metrology. In: IT Professional. 2018 ; Vol. 20, No. 3. pp. 6-10.
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IoT metrology. / Voas, Jeffrey; Kuhn, Rick; Laplante, Phillip A.

In: IT Professional, Vol. 20, No. 3, 01.05.2018, p. 6-10.

Research output: Contribution to journalReview article

TY - JOUR

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AU - Voas, Jeffrey

AU - Kuhn, Rick

AU - Laplante, Phillip A.

PY - 2018/5/1

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DO - 10.1109/MITP.2018.032501740

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