IoT metrology

Jeffrey Voas, Rick Kuhn, Phillip A. Laplante

Research output: Contribution to journalReview articlepeer-review


In the Internet of Things (IoT), what can we measure? The authors explore how the field of metrology might be applicable to the IoT.

Original languageEnglish (US)
Pages (from-to)6-10
Number of pages5
JournalIT Professional
Issue number3
StatePublished - May 1 2018

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Science Applications

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