Irradiation-enhanced second-phase precipitation in Zr-Fe nanocrystalline thin films

D. Kaoumi, Arthur Thompson Motta, R. C. Birtcher

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In situ observations in a transmission electron microscope (TEM) were used to study ion-beam enhancement of second-phase precipitation in Zr-Fe nanocrystalline thin films. The free-standing films were prepared by co-sputter deposition with an Fe content of 1.2 at%. TEM diffraction analysis showed that only the hep Zr crystal structure was present in the as-deposited films. No second phases were detected, although Rutherford Backscattering Spectroscopy (RBS) confirmed a Fe content beyond the solubility limit of Fe in Zr (of the order of ppm). This means the thin films were Zr solid solutions supersaturated with Fe. Heat treatment in the absence of irradiation was observed to cause precipitation of the Zr2Fe intermetallic phase, but only above 673 K. The same second-phase precipitation can occur at lower temperatures in the presence of ion irradiation. Samples were irradiated in-situ at the Intermediate Voltage Electron Microscope (IVEM) at Argonne National Laboratory with Kr ions to fluences in excess of 1016 ion/cm2, at temperatures ranging from 50 to 573 K. Second phase precipitation was detected by electron diffraction patterns and by dark field imaging comparing regions exposed to the beam with regions protected from the beam by the TEM support grid. Precipitation of Zr2Fe intermetallic phase was observed at all irradiating temperatures above room temperature. In the bulk, this phase is thermodynamically metastable in the range of temperatures investigated (relative to the orthorhombic Zr3Fe intermetallic phase). The kinetics of the irradiation-enhanced second-phase precipitation was followed by recording the diffraction patterns at regular intervals. The dose to precipitation was found to decrease with increasing irradiation temperature.

Original languageEnglish (US)
Title of host publicationGrowth, Modification and Analysis by Ion Beams at the Nanoscale
Pages7-12
Number of pages6
StatePublished - Dec 1 2005
Event2005 MRS Fall Meeting - Boston, MA, United States
Duration: Nov 28 2005Dec 2 2005

Publication series

NameMaterials Research Society Symposium Proceedings
Volume908
ISSN (Print)0272-9172

Other

Other2005 MRS Fall Meeting
CountryUnited States
CityBoston, MA
Period11/28/0512/2/05

Fingerprint

Irradiation
Thin films
Electron microscopes
Intermetallics
Temperature
Diffraction patterns
Ions
Sputter deposition
Rutherford backscattering spectroscopy
Ion bombardment
Electron diffraction
Ion beams
Solid solutions
Solubility
Diffraction
Crystal structure
Heat treatment
Imaging techniques
Kinetics
Electric potential

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Kaoumi, D., Motta, A. T., & Birtcher, R. C. (2005). Irradiation-enhanced second-phase precipitation in Zr-Fe nanocrystalline thin films. In Growth, Modification and Analysis by Ion Beams at the Nanoscale (pp. 7-12). (Materials Research Society Symposium Proceedings; Vol. 908).
Kaoumi, D. ; Motta, Arthur Thompson ; Birtcher, R. C. / Irradiation-enhanced second-phase precipitation in Zr-Fe nanocrystalline thin films. Growth, Modification and Analysis by Ion Beams at the Nanoscale. 2005. pp. 7-12 (Materials Research Society Symposium Proceedings).
@inproceedings{728ab11cea2944f5b737a3fe9f9b1223,
title = "Irradiation-enhanced second-phase precipitation in Zr-Fe nanocrystalline thin films",
abstract = "In situ observations in a transmission electron microscope (TEM) were used to study ion-beam enhancement of second-phase precipitation in Zr-Fe nanocrystalline thin films. The free-standing films were prepared by co-sputter deposition with an Fe content of 1.2 at{\%}. TEM diffraction analysis showed that only the hep Zr crystal structure was present in the as-deposited films. No second phases were detected, although Rutherford Backscattering Spectroscopy (RBS) confirmed a Fe content beyond the solubility limit of Fe in Zr (of the order of ppm). This means the thin films were Zr solid solutions supersaturated with Fe. Heat treatment in the absence of irradiation was observed to cause precipitation of the Zr2Fe intermetallic phase, but only above 673 K. The same second-phase precipitation can occur at lower temperatures in the presence of ion irradiation. Samples were irradiated in-situ at the Intermediate Voltage Electron Microscope (IVEM) at Argonne National Laboratory with Kr ions to fluences in excess of 1016 ion/cm2, at temperatures ranging from 50 to 573 K. Second phase precipitation was detected by electron diffraction patterns and by dark field imaging comparing regions exposed to the beam with regions protected from the beam by the TEM support grid. Precipitation of Zr2Fe intermetallic phase was observed at all irradiating temperatures above room temperature. In the bulk, this phase is thermodynamically metastable in the range of temperatures investigated (relative to the orthorhombic Zr3Fe intermetallic phase). The kinetics of the irradiation-enhanced second-phase precipitation was followed by recording the diffraction patterns at regular intervals. The dose to precipitation was found to decrease with increasing irradiation temperature.",
author = "D. Kaoumi and Motta, {Arthur Thompson} and Birtcher, {R. C.}",
year = "2005",
month = "12",
day = "1",
language = "English (US)",
isbn = "1558998632",
series = "Materials Research Society Symposium Proceedings",
pages = "7--12",
booktitle = "Growth, Modification and Analysis by Ion Beams at the Nanoscale",

}

Kaoumi, D, Motta, AT & Birtcher, RC 2005, Irradiation-enhanced second-phase precipitation in Zr-Fe nanocrystalline thin films. in Growth, Modification and Analysis by Ion Beams at the Nanoscale. Materials Research Society Symposium Proceedings, vol. 908, pp. 7-12, 2005 MRS Fall Meeting, Boston, MA, United States, 11/28/05.

Irradiation-enhanced second-phase precipitation in Zr-Fe nanocrystalline thin films. / Kaoumi, D.; Motta, Arthur Thompson; Birtcher, R. C.

Growth, Modification and Analysis by Ion Beams at the Nanoscale. 2005. p. 7-12 (Materials Research Society Symposium Proceedings; Vol. 908).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Irradiation-enhanced second-phase precipitation in Zr-Fe nanocrystalline thin films

AU - Kaoumi, D.

AU - Motta, Arthur Thompson

AU - Birtcher, R. C.

PY - 2005/12/1

Y1 - 2005/12/1

N2 - In situ observations in a transmission electron microscope (TEM) were used to study ion-beam enhancement of second-phase precipitation in Zr-Fe nanocrystalline thin films. The free-standing films were prepared by co-sputter deposition with an Fe content of 1.2 at%. TEM diffraction analysis showed that only the hep Zr crystal structure was present in the as-deposited films. No second phases were detected, although Rutherford Backscattering Spectroscopy (RBS) confirmed a Fe content beyond the solubility limit of Fe in Zr (of the order of ppm). This means the thin films were Zr solid solutions supersaturated with Fe. Heat treatment in the absence of irradiation was observed to cause precipitation of the Zr2Fe intermetallic phase, but only above 673 K. The same second-phase precipitation can occur at lower temperatures in the presence of ion irradiation. Samples were irradiated in-situ at the Intermediate Voltage Electron Microscope (IVEM) at Argonne National Laboratory with Kr ions to fluences in excess of 1016 ion/cm2, at temperatures ranging from 50 to 573 K. Second phase precipitation was detected by electron diffraction patterns and by dark field imaging comparing regions exposed to the beam with regions protected from the beam by the TEM support grid. Precipitation of Zr2Fe intermetallic phase was observed at all irradiating temperatures above room temperature. In the bulk, this phase is thermodynamically metastable in the range of temperatures investigated (relative to the orthorhombic Zr3Fe intermetallic phase). The kinetics of the irradiation-enhanced second-phase precipitation was followed by recording the diffraction patterns at regular intervals. The dose to precipitation was found to decrease with increasing irradiation temperature.

AB - In situ observations in a transmission electron microscope (TEM) were used to study ion-beam enhancement of second-phase precipitation in Zr-Fe nanocrystalline thin films. The free-standing films were prepared by co-sputter deposition with an Fe content of 1.2 at%. TEM diffraction analysis showed that only the hep Zr crystal structure was present in the as-deposited films. No second phases were detected, although Rutherford Backscattering Spectroscopy (RBS) confirmed a Fe content beyond the solubility limit of Fe in Zr (of the order of ppm). This means the thin films were Zr solid solutions supersaturated with Fe. Heat treatment in the absence of irradiation was observed to cause precipitation of the Zr2Fe intermetallic phase, but only above 673 K. The same second-phase precipitation can occur at lower temperatures in the presence of ion irradiation. Samples were irradiated in-situ at the Intermediate Voltage Electron Microscope (IVEM) at Argonne National Laboratory with Kr ions to fluences in excess of 1016 ion/cm2, at temperatures ranging from 50 to 573 K. Second phase precipitation was detected by electron diffraction patterns and by dark field imaging comparing regions exposed to the beam with regions protected from the beam by the TEM support grid. Precipitation of Zr2Fe intermetallic phase was observed at all irradiating temperatures above room temperature. In the bulk, this phase is thermodynamically metastable in the range of temperatures investigated (relative to the orthorhombic Zr3Fe intermetallic phase). The kinetics of the irradiation-enhanced second-phase precipitation was followed by recording the diffraction patterns at regular intervals. The dose to precipitation was found to decrease with increasing irradiation temperature.

UR - http://www.scopus.com/inward/record.url?scp=34249950175&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34249950175&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:34249950175

SN - 1558998632

SN - 9781558998636

T3 - Materials Research Society Symposium Proceedings

SP - 7

EP - 12

BT - Growth, Modification and Analysis by Ion Beams at the Nanoscale

ER -

Kaoumi D, Motta AT, Birtcher RC. Irradiation-enhanced second-phase precipitation in Zr-Fe nanocrystalline thin films. In Growth, Modification and Analysis by Ion Beams at the Nanoscale. 2005. p. 7-12. (Materials Research Society Symposium Proceedings).