Is the concern for soft-error overblown?

Sandip Kundu, Rajesh Galivanche, Vijaykrishnan Narayanan, Rajesh Raina, Pia Sanda, Kaushik Roy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Soft-Error caused by ionizing radiation has emerged as a cause for great concern. It is argued that with scaling of transistor feature size, soft-error rate will increase by orders of magnitude and special solutions will be needed to deal with this problem. However, anecdotal evidence suggests soft-error is not the leading cause of transient faults today; the power supply droop, unforeseen workloads, thermal hot spots, active voltage, frequency and temperature regulation related issues cause problems with far greater incidence. While a problem is a problem, is engineering focus on soft-error the right priority? Is soft-error likely to dominate transient faults in future? Should this become a central focus during design process?

Original languageEnglish (US)
Title of host publicationIEEE International Test Conference, Proceedings, ITC 2005
Number of pages1
DOIs
StatePublished - Dec 1 2005
EventIEEE International Test Conference, ITC 2005 - Austin, TX, United States
Duration: Nov 8 2005Nov 10 2005

Publication series

NameProceedings - International Test Conference
Volume2005
ISSN (Print)1089-3539

Other

OtherIEEE International Test Conference, ITC 2005
CountryUnited States
CityAustin, TX
Period11/8/0511/10/05

Fingerprint

Soft Error
Transient Faults
Ionizing radiation
Hot Spot
Design Process
Workload
Error Rate
Incidence
Transistors
Likely
Voltage
Radiation
Scaling
Engineering
Electric potential

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics

Cite this

Kundu, S., Galivanche, R., Narayanan, V., Raina, R., Sanda, P., & Roy, K. (2005). Is the concern for soft-error overblown? In IEEE International Test Conference, Proceedings, ITC 2005 [1584100] (Proceedings - International Test Conference; Vol. 2005). https://doi.org/10.1109/TEST.2005.1584100
Kundu, Sandip ; Galivanche, Rajesh ; Narayanan, Vijaykrishnan ; Raina, Rajesh ; Sanda, Pia ; Roy, Kaushik. / Is the concern for soft-error overblown?. IEEE International Test Conference, Proceedings, ITC 2005. 2005. (Proceedings - International Test Conference).
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Kundu, S, Galivanche, R, Narayanan, V, Raina, R, Sanda, P & Roy, K 2005, Is the concern for soft-error overblown? in IEEE International Test Conference, Proceedings, ITC 2005., 1584100, Proceedings - International Test Conference, vol. 2005, IEEE International Test Conference, ITC 2005, Austin, TX, United States, 11/8/05. https://doi.org/10.1109/TEST.2005.1584100

Is the concern for soft-error overblown? / Kundu, Sandip; Galivanche, Rajesh; Narayanan, Vijaykrishnan; Raina, Rajesh; Sanda, Pia; Roy, Kaushik.

IEEE International Test Conference, Proceedings, ITC 2005. 2005. 1584100 (Proceedings - International Test Conference; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Kundu S, Galivanche R, Narayanan V, Raina R, Sanda P, Roy K. Is the concern for soft-error overblown? In IEEE International Test Conference, Proceedings, ITC 2005. 2005. 1584100. (Proceedings - International Test Conference). https://doi.org/10.1109/TEST.2005.1584100