Soft-Error caused by ionizing radiation has emerged as a cause for great concern. It is argued that with scaling of transistor feature size, soft-error rate will increase by orders of magnitude and special solutions will be needed to deal with this problem. However, anecdotal evidence suggests soft-error is not the leading cause of transient faults today; the power supply droop, unforeseen workloads, thermal hot spots, active voltage, frequency and temperature regulation related issues cause problems with far greater incidence. While a problem is a problem, is engineering focus on soft-error the right priority? Is soft-error likely to dominate transient faults in future? Should this become a central focus during design process?