Kinetics of oxygen diffusion into multilayer ceramic capacitors during the re-oxidation process and its implications on dielectric properties

Kazumi Kaneda, Youichi Mizuno, Niall J. Donnelly, Soonil Lee, Weiguo Qu, Clive A. Randall

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Re-oxidation is an important thermal process to minimize oxygen vacancies and produce high reliable Ni-MLCCs. The re-oxidation of these devices is then investigated with a series of "in-situ" impedance measurements between 400 and 500 °C in air. From the relative impedance change, chemical diffusion coefficients, associated activation energy and effective equivalent circuit model are determined. Those values were found to be reasonable compared with previous researchers' data. Moreover, the proposed effective equivalent circuit model successfully represents the real Ni-MLCC morphology. From transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS), it is found that the electrical properties and reliabilities of the Ni-MLCCs re-oxidized under different conditions are identical.

Original languageEnglish (US)
Title of host publicationElectroceramics in Japan XIV
Pages43-46
Number of pages4
DOIs
StatePublished - Jul 26 2011
Event30th Electronics Division Meeting of the Ceramic Society of Japan - Tokyo, Japan
Duration: Oct 29 2010Oct 30 2010

Publication series

NameKey Engineering Materials
Volume485
ISSN (Print)1013-9826

Other

Other30th Electronics Division Meeting of the Ceramic Society of Japan
CountryJapan
CityTokyo
Period10/29/1010/30/10

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Kaneda, K., Mizuno, Y., Donnelly, N. J., Lee, S., Qu, W., & Randall, C. A. (2011). Kinetics of oxygen diffusion into multilayer ceramic capacitors during the re-oxidation process and its implications on dielectric properties. In Electroceramics in Japan XIV (pp. 43-46). (Key Engineering Materials; Vol. 485). https://doi.org/10.4028/www.scientific.net/KEM.485.43