Large area strain analysis using scanning transmission electron microscopy across multiple images

A. A. Oni, X. Sang, S. V. Raju, S. Dumpala, S. Broderick, A. Kumar, Susan B. Sinnott, S. Saxena, K. Rajan, J. M. Lebeau

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Abstract

Here, we apply revolving scanning transmission electron microscopy to measure lattice strain across a sample using a single reference area. To do so, we remove image distortion introduced by sample drift, which usually restricts strain analysis to a single image. Overcoming this challenge, we show that it is possible to use strain reference areas elsewhere in the sample, thereby enabling reliable strain mapping across large areas. As a prototypical example, we determine the strain present within the microstructure of a Ni-based superalloy directly from atom column positions as well as geometric phase analysis. While maintaining atomic resolution, we quantify strain within nanoscale regions and demonstrate that large, unit-cell level strain fluctuations are present within the intermetallic phase.

Original languageEnglish (US)
Article number011601
JournalApplied Physics Letters
Volume106
Issue number1
DOIs
Publication statusPublished - Jan 5 2015

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Oni, A. A., Sang, X., Raju, S. V., Dumpala, S., Broderick, S., Kumar, A., ... Lebeau, J. M. (2015). Large area strain analysis using scanning transmission electron microscopy across multiple images. Applied Physics Letters, 106(1), [011601]. https://doi.org/10.1063/1.4905368