Large critical current densities in YBa2Cu3O 7-x thin films made at high deposition rates

X. D. Wu, R. E. Muenchausen, S. Foltyn, R. C. Estler, R. C. Dye, A. R. Garcia, N. S. Nogar, P. England, R. Ramesh, D. M. Hwang, T. S. Ravi, C. C. Chang, T. Venkatesan, X. X. Xi, Qi Li, A. Inam

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Abstract

Critical current densities (Jc) in YBa2Cu 3O7-x films made at deposition rates from 0.1 to 14.5 nm/s (∼50 μm/h) were measured using a direct transport method. As the deposition rate was increased by two orders of magnitude, the films exhibited no marked degradation in current carrying capability with Jc of ∼4×106 A/cm2 at 77 K and zero field. J c for all the films showed similar behavior under a magnetic field up to 8 T, although extra structural defects were found in the films deposited at the higher rates. The results from this experiment indicate the feasibility for coating wires, tapes, and other macroscopic shapes with high Tc superconductors using proper vapor deposition techniques.

Original languageEnglish (US)
Pages (from-to)523-525
Number of pages3
JournalApplied Physics Letters
Volume57
Issue number5
DOIs
StatePublished - Dec 1 1990

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critical current
current density
thin films
tapes
vapor deposition
wire
degradation
coatings
defects
magnetic fields

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Wu, X. D., Muenchausen, R. E., Foltyn, S., Estler, R. C., Dye, R. C., Garcia, A. R., ... Inam, A. (1990). Large critical current densities in YBa2Cu3O 7-x thin films made at high deposition rates. Applied Physics Letters, 57(5), 523-525. https://doi.org/10.1063/1.104245
Wu, X. D. ; Muenchausen, R. E. ; Foltyn, S. ; Estler, R. C. ; Dye, R. C. ; Garcia, A. R. ; Nogar, N. S. ; England, P. ; Ramesh, R. ; Hwang, D. M. ; Ravi, T. S. ; Chang, C. C. ; Venkatesan, T. ; Xi, X. X. ; Li, Qi ; Inam, A. / Large critical current densities in YBa2Cu3O 7-x thin films made at high deposition rates. In: Applied Physics Letters. 1990 ; Vol. 57, No. 5. pp. 523-525.
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abstract = "Critical current densities (Jc) in YBa2Cu 3O7-x films made at deposition rates from 0.1 to 14.5 nm/s (∼50 μm/h) were measured using a direct transport method. As the deposition rate was increased by two orders of magnitude, the films exhibited no marked degradation in current carrying capability with Jc of ∼4×106 A/cm2 at 77 K and zero field. J c for all the films showed similar behavior under a magnetic field up to 8 T, although extra structural defects were found in the films deposited at the higher rates. The results from this experiment indicate the feasibility for coating wires, tapes, and other macroscopic shapes with high Tc superconductors using proper vapor deposition techniques.",
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Wu, XD, Muenchausen, RE, Foltyn, S, Estler, RC, Dye, RC, Garcia, AR, Nogar, NS, England, P, Ramesh, R, Hwang, DM, Ravi, TS, Chang, CC, Venkatesan, T, Xi, XX, Li, Q & Inam, A 1990, 'Large critical current densities in YBa2Cu3O 7-x thin films made at high deposition rates', Applied Physics Letters, vol. 57, no. 5, pp. 523-525. https://doi.org/10.1063/1.104245

Large critical current densities in YBa2Cu3O 7-x thin films made at high deposition rates. / Wu, X. D.; Muenchausen, R. E.; Foltyn, S.; Estler, R. C.; Dye, R. C.; Garcia, A. R.; Nogar, N. S.; England, P.; Ramesh, R.; Hwang, D. M.; Ravi, T. S.; Chang, C. C.; Venkatesan, T.; Xi, X. X.; Li, Qi; Inam, A.

In: Applied Physics Letters, Vol. 57, No. 5, 01.12.1990, p. 523-525.

Research output: Contribution to journalArticle

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T1 - Large critical current densities in YBa2Cu3O 7-x thin films made at high deposition rates

AU - Wu, X. D.

AU - Muenchausen, R. E.

AU - Foltyn, S.

AU - Estler, R. C.

AU - Dye, R. C.

AU - Garcia, A. R.

AU - Nogar, N. S.

AU - England, P.

AU - Ramesh, R.

AU - Hwang, D. M.

AU - Ravi, T. S.

AU - Chang, C. C.

AU - Venkatesan, T.

AU - Xi, X. X.

AU - Li, Qi

AU - Inam, A.

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Wu XD, Muenchausen RE, Foltyn S, Estler RC, Dye RC, Garcia AR et al. Large critical current densities in YBa2Cu3O 7-x thin films made at high deposition rates. Applied Physics Letters. 1990 Dec 1;57(5):523-525. https://doi.org/10.1063/1.104245