Laser interferometer for the study of piezoelectric and electrostrictive strains

Qiming Zhang, W. Y. Pan, L. E. Cross

Research output: Contribution to journalArticle

147 Citations (Scopus)

Abstract

A modified Michelson interferometer is used to study the strain properties of piezoelectric and electrostrictive materials. For small displacement, a feedback loop is introduced to stabilize the system against the low-frequency optical path-length drifting and the system is capable of resolving displacements of the order of 10-3 Å. For the strain induced by domain switching, a dual-channel signal detection scheme is used which automatically reads out the displacement of the sample. The effect on the measurement of the sample bonding to a substrate and other related problems are discussed.

Original languageEnglish (US)
Pages (from-to)2492-2496
Number of pages5
JournalJournal of Applied Physics
Volume63
Issue number8
DOIs
StatePublished - Dec 1 1988

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interferometers
lasers
signal detection
Michelson interferometers
optical paths
low frequencies

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

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Laser interferometer for the study of piezoelectric and electrostrictive strains. / Zhang, Qiming; Pan, W. Y.; Cross, L. E.

In: Journal of Applied Physics, Vol. 63, No. 8, 01.12.1988, p. 2492-2496.

Research output: Contribution to journalArticle

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AU - Cross, L. E.

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