Laser interferometer for the study of piezoelectric and electrostrictive strains

Qiming Zhang, W. Y. Pan, L. E. Cross

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Abstract

A modified Michelson interferometer is used to study the strain properties of piezoelectric and electrostrictive materials. For small displacement, a feedback loop is introduced to stabilize the system against the low-frequency optical path-length drifting and the system is capable of resolving displacements of the order of 10-3 Å. For the strain induced by domain switching, a dual-channel signal detection scheme is used which automatically reads out the displacement of the sample. The effect on the measurement of the sample bonding to a substrate and other related problems are discussed.

Original languageEnglish (US)
Pages (from-to)2492-2496
Number of pages5
JournalJournal of Applied Physics
Volume63
Issue number8
DOIs
Publication statusPublished - Dec 1 1988

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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