Layering and Layer-Critical-Point Transitions of Ethylene on Graphite

Qiming Zhang, Y. P. Feng, H. K. Kim, Moses Hung-Wai Chan

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

Results of an ac heat-capacity study of layering, melting, and layer-critical-point transitions of multilayer C2D4 on graphite are reported. The layer critical temperature is found to decrease towards the bulk triple melting point with increasing film thickness. The wetting transition also appeared to be pinned at the triple point. The layer-critical-point transition of a film between one and two layers is found to be 2D Ising type.

Original languageEnglish (US)
Pages (from-to)1456-1459
Number of pages4
JournalPhysical Review Letters
Volume57
Issue number12
DOIs
StatePublished - Jan 1 1986

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critical point
ethylene
graphite
wetting
melting points
critical temperature
film thickness
melting
specific heat

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Zhang, Qiming ; Feng, Y. P. ; Kim, H. K. ; Chan, Moses Hung-Wai. / Layering and Layer-Critical-Point Transitions of Ethylene on Graphite. In: Physical Review Letters. 1986 ; Vol. 57, No. 12. pp. 1456-1459.
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Layering and Layer-Critical-Point Transitions of Ethylene on Graphite. / Zhang, Qiming; Feng, Y. P.; Kim, H. K.; Chan, Moses Hung-Wai.

In: Physical Review Letters, Vol. 57, No. 12, 01.01.1986, p. 1456-1459.

Research output: Contribution to journalArticle

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