We examine theoretically and experimentally an imaging scheme that uses the transverse intensity profile of the scattered light to reconstruct the locations of absorbers embedded in a turbid medium. This method is based on an a priori knowledge of the scattered light patterns associated with a single absorber that is located at various positions inside the medium. We discuss the range of validity of this method, and its sensitivity with regard to noise, and propose an algorithm to improve its accuracy.
|Original language||English (US)|
|Journal||Physical Review A - Atomic, Molecular, and Optical Physics|
|State||Published - Feb 20 2008|
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics