Local magnetic characterization of (Ga,Mn)As continuous thin film using scanning probe force microscopy

Inhee Lee, Yuri Obukhov, Jongjoo Kim, Xia Li, Nitin Samarth, Denis V. Pelekhov, P. Chris Hammel

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

We report spatially resolved measurements of the saturation magnetization, anisotropy field, and g factor of a (Ga,Mn)As thin film using two different scanning probe techniques: ferromagnetic resonance force microscopy and probe-induced magnetic force microscopy. We find that the magnetic properties of the film are uniform within our 1-μm lateral resolution. We further demonstrate that these two powerful and complementary magnetic characterization approaches, the former dynamic and the latter static, obtain measurements of magnetic properties that are in excellent agreement with one another, enabling enhanced quantitative reliability.

Original languageEnglish (US)
Article number184402
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume85
Issue number18
DOIs
StatePublished - May 2 2012

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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