Localized terahertz generation via optical rectification in ZnTe

Georgi L. Dakovski, Brian Kubera, Jie Shan

Research output: Contribution to journalArticle

44 Citations (Scopus)

Abstract

We report the measurement of terahertz (THz) radiation, generated via optical rectification in a 20 μm thick ZnTe crystal, as a function of the size of optical excitation. The result shows that, before the onset of significant higher-order nonlinear processes, the THz emission obtained with a fixed excitation power is largely size independent for excitation sizes smaller than the THz wavelength. This experimental finding is well described by a theoretical model including the generation of THz radiation through optical rectification from a subwavelength source and its propagation into the far field. The characteristic size dependence of the radiation from a subwavelength THz source is advantageous for use in apertureless near-field microscopy.

Original languageEnglish (US)
Pages (from-to)1667-1670
Number of pages4
JournalJournal of the Optical Society of America B: Optical Physics
Volume22
Issue number8
DOIs
StatePublished - Jan 1 2005

Fingerprint

rectification
radiation
excitation
far fields
near fields
microscopy
propagation
wavelengths
crystals

All Science Journal Classification (ASJC) codes

  • Statistical and Nonlinear Physics
  • Atomic and Molecular Physics, and Optics

Cite this

Dakovski, Georgi L. ; Kubera, Brian ; Shan, Jie. / Localized terahertz generation via optical rectification in ZnTe. In: Journal of the Optical Society of America B: Optical Physics. 2005 ; Vol. 22, No. 8. pp. 1667-1670.
@article{c3f515944b284094a4812344729d0685,
title = "Localized terahertz generation via optical rectification in ZnTe",
abstract = "We report the measurement of terahertz (THz) radiation, generated via optical rectification in a 20 μm thick ZnTe crystal, as a function of the size of optical excitation. The result shows that, before the onset of significant higher-order nonlinear processes, the THz emission obtained with a fixed excitation power is largely size independent for excitation sizes smaller than the THz wavelength. This experimental finding is well described by a theoretical model including the generation of THz radiation through optical rectification from a subwavelength source and its propagation into the far field. The characteristic size dependence of the radiation from a subwavelength THz source is advantageous for use in apertureless near-field microscopy.",
author = "Dakovski, {Georgi L.} and Brian Kubera and Jie Shan",
year = "2005",
month = "1",
day = "1",
doi = "10.1364/JOSAB.22.001667",
language = "English (US)",
volume = "22",
pages = "1667--1670",
journal = "Journal of the Optical Society of America B: Optical Physics",
issn = "0740-3224",
publisher = "The Optical Society",
number = "8",

}

Localized terahertz generation via optical rectification in ZnTe. / Dakovski, Georgi L.; Kubera, Brian; Shan, Jie.

In: Journal of the Optical Society of America B: Optical Physics, Vol. 22, No. 8, 01.01.2005, p. 1667-1670.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Localized terahertz generation via optical rectification in ZnTe

AU - Dakovski, Georgi L.

AU - Kubera, Brian

AU - Shan, Jie

PY - 2005/1/1

Y1 - 2005/1/1

N2 - We report the measurement of terahertz (THz) radiation, generated via optical rectification in a 20 μm thick ZnTe crystal, as a function of the size of optical excitation. The result shows that, before the onset of significant higher-order nonlinear processes, the THz emission obtained with a fixed excitation power is largely size independent for excitation sizes smaller than the THz wavelength. This experimental finding is well described by a theoretical model including the generation of THz radiation through optical rectification from a subwavelength source and its propagation into the far field. The characteristic size dependence of the radiation from a subwavelength THz source is advantageous for use in apertureless near-field microscopy.

AB - We report the measurement of terahertz (THz) radiation, generated via optical rectification in a 20 μm thick ZnTe crystal, as a function of the size of optical excitation. The result shows that, before the onset of significant higher-order nonlinear processes, the THz emission obtained with a fixed excitation power is largely size independent for excitation sizes smaller than the THz wavelength. This experimental finding is well described by a theoretical model including the generation of THz radiation through optical rectification from a subwavelength source and its propagation into the far field. The characteristic size dependence of the radiation from a subwavelength THz source is advantageous for use in apertureless near-field microscopy.

UR - http://www.scopus.com/inward/record.url?scp=24144434130&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=24144434130&partnerID=8YFLogxK

U2 - 10.1364/JOSAB.22.001667

DO - 10.1364/JOSAB.22.001667

M3 - Article

AN - SCOPUS:24144434130

VL - 22

SP - 1667

EP - 1670

JO - Journal of the Optical Society of America B: Optical Physics

JF - Journal of the Optical Society of America B: Optical Physics

SN - 0740-3224

IS - 8

ER -