Localized terahertz generation via optical rectification in ZnTe

Georgi L. Dakovski, Brian Kubera, Jie Shan

Research output: Contribution to journalArticlepeer-review

49 Scopus citations


We report the measurement of terahertz (THz) radiation, generated via optical rectification in a 20 μm thick ZnTe crystal, as a function of the size of optical excitation. The result shows that, before the onset of significant higher-order nonlinear processes, the THz emission obtained with a fixed excitation power is largely size independent for excitation sizes smaller than the THz wavelength. This experimental finding is well described by a theoretical model including the generation of THz radiation through optical rectification from a subwavelength source and its propagation into the far field. The characteristic size dependence of the radiation from a subwavelength THz source is advantageous for use in apertureless near-field microscopy.

Original languageEnglish (US)
Pages (from-to)1667-1670
Number of pages4
JournalJournal of the Optical Society of America B: Optical Physics
Issue number8
StatePublished - Aug 2005

All Science Journal Classification (ASJC) codes

  • Statistical and Nonlinear Physics
  • Atomic and Molecular Physics, and Optics


Dive into the research topics of 'Localized terahertz generation via optical rectification in ZnTe'. Together they form a unique fingerprint.

Cite this