Looking at surfaces with cluster ion beams

Juan Cheng, Nicholas Winograd

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

The characterization of the near-surface region of a solid can be done using various mass-spectrometry-based techniques such as secondary ion mass spectrometry (SIMS). The development of cluster ion beams allow SIMS to provide molecular information of surfaces that is equivalent to matrix-assisted laser desorption ionization mass spectrometry (MALDI) technique and yet manages to retain its unique surface sensitivity and imaging properties. The introduction of a Au cluster liquid metal ion gun (LMIG) and a gas C60 + could be focused to a probe size of a few microns. New rules for the implementation of secondary ion mass spectrometry are emerging that suggest it may complement MALDI experiments in many research domains.

Original languageEnglish (US)
Pages (from-to)50-51
Number of pages2
JournalMaterials Today
Volume9
Issue number1-2
DOIs
StatePublished - Jan 1 2006

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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