The characterization of the near-surface region of a solid can be done using various mass-spectrometry-based techniques such as secondary ion mass spectrometry (SIMS). The development of cluster ion beams allow SIMS to provide molecular information of surfaces that is equivalent to matrix-assisted laser desorption ionization mass spectrometry (MALDI) technique and yet manages to retain its unique surface sensitivity and imaging properties. The introduction of a Au cluster liquid metal ion gun (LMIG) and a gas C60 + could be focused to a probe size of a few microns. New rules for the implementation of secondary ion mass spectrometry are emerging that suggest it may complement MALDI experiments in many research domains.
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering