Abstract
This paper reports the laser Doppler vibrometry based measurement of the magnetostriction in magnetic thin films. Using this method, the strain induced by an AC magnetic field in the polycrystalline cobalt ferrite and nickel ferrite thin films grown on silicon and platinized silicon substrates was measured under a DC magnetic bias. The experimental setup and the derivation of the magnetostriction constant from the experimentally measured deflection values are discussed. The magnetostriction values derived using force and bending moment balances were compared with that derived from an industry standard relationship. In addition, we corroborate our approach by comparing the values derived from bending theory calculations of magnetically induced torque to those from measurements using Vibrating Sample Magnetometer (VSM). At high DC magnetic field bias, the magnitude of magnetization calculated from the measured magnetostriction was found to match the measured magnetization by VSM.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 179-187 |
| Number of pages | 9 |
| Journal | Journal of Magnetism and Magnetic Materials |
| Volume | 363 |
| DOIs | |
| State | Published - Jan 1 2014 |
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All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Electronic, Optical and Magnetic Materials
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Magnetostriction measurement in thin films using laser Doppler vibrometry. / Varghese, Ronnie; Viswan, Ravindranath; Joshi, Keyur; Seifikar, Safoura; Zhou, Yuan; Schwartz, Justin; Priya, Shashank.
In: Journal of Magnetism and Magnetic Materials, Vol. 363, 01.01.2014, p. 179-187.Research output: Contribution to journal › Article
TY - JOUR
T1 - Magnetostriction measurement in thin films using laser Doppler vibrometry
AU - Varghese, Ronnie
AU - Viswan, Ravindranath
AU - Joshi, Keyur
AU - Seifikar, Safoura
AU - Zhou, Yuan
AU - Schwartz, Justin
AU - Priya, Shashank
PY - 2014/1/1
Y1 - 2014/1/1
N2 - This paper reports the laser Doppler vibrometry based measurement of the magnetostriction in magnetic thin films. Using this method, the strain induced by an AC magnetic field in the polycrystalline cobalt ferrite and nickel ferrite thin films grown on silicon and platinized silicon substrates was measured under a DC magnetic bias. The experimental setup and the derivation of the magnetostriction constant from the experimentally measured deflection values are discussed. The magnetostriction values derived using force and bending moment balances were compared with that derived from an industry standard relationship. In addition, we corroborate our approach by comparing the values derived from bending theory calculations of magnetically induced torque to those from measurements using Vibrating Sample Magnetometer (VSM). At high DC magnetic field bias, the magnitude of magnetization calculated from the measured magnetostriction was found to match the measured magnetization by VSM.
AB - This paper reports the laser Doppler vibrometry based measurement of the magnetostriction in magnetic thin films. Using this method, the strain induced by an AC magnetic field in the polycrystalline cobalt ferrite and nickel ferrite thin films grown on silicon and platinized silicon substrates was measured under a DC magnetic bias. The experimental setup and the derivation of the magnetostriction constant from the experimentally measured deflection values are discussed. The magnetostriction values derived using force and bending moment balances were compared with that derived from an industry standard relationship. In addition, we corroborate our approach by comparing the values derived from bending theory calculations of magnetically induced torque to those from measurements using Vibrating Sample Magnetometer (VSM). At high DC magnetic field bias, the magnitude of magnetization calculated from the measured magnetostriction was found to match the measured magnetization by VSM.
UR - http://www.scopus.com/inward/record.url?scp=84898814479&partnerID=8YFLogxK
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U2 - 10.1016/j.jmmm.2014.03.076
DO - 10.1016/j.jmmm.2014.03.076
M3 - Article
AN - SCOPUS:84898814479
VL - 363
SP - 179
EP - 187
JO - Journal of Magnetism and Magnetic Materials
JF - Journal of Magnetism and Magnetic Materials
SN - 0304-8853
ER -