Mapping piezoelectric nonlinearity in the Rayleigh regime using band excitation piezoresponse force microscopy

F. Griggio, S. Jesse, A. Kumar, D. M. Marincel, D. S. Tinberg, S. V. Kalinin, S. Trolier-Mckinstry

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Abstract

Band excitation piezoresponse force microscopy enables local investigation of the nonlinear piezoelectric behavior of ferroelectric thin films. However, the presence of additional nonlinearity associated with the dynamic resonant response of the tip-surface junction can complicate the study of a material's nonlinearity. Here, the relative importance of the two nonlinearity sources was examined as a function of the excitation function. It was found that in order to minimize the effects of nonlinear tip-surface interactions but achieve good signal to noise level, an optimal excitation function must be used.

Original languageEnglish (US)
Article number212901
JournalApplied Physics Letters
Volume98
Issue number21
DOIs
StatePublished - May 23 2011

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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