@article{a060d05e469c4e0db1b320347dd23db1,
title = "Materials analysis and particle probe: A compact diagnostic system for in situ analysis of plasma-facing components (invited)",
abstract = "The objective of the materials analysis particle probe (MAPP) in NSTX is to enable prompt and direct analysis of plasma-facing components exposed to plasma discharges. MAPP allows multiple samples to be introduced to the level of the plasma-facing surface without breaking vacuum and analyzed using X-ray photoelectron spectroscopy (XPS), ion-scattering and direct recoil spectroscopy, and thermal desorption spectroscopy (TDS) immediately following the plasma discharge. MAPP is designed to operate as a diagnostic within the ∼12 min NSTX minimum between-shot time window to reveal fundamental plasma-surface interactions. Initial calibration demonstrates MAPPs XPS and TDS capabilities.",
author = "Taylor, {C. N.} and B. Heim and S. Gonderman and Allain, {J. P.} and Z. Yang and R. Kaita and Roquemore, {A. L.} and Skinner, {C. H.} and Ellis, {R. A.}",
note = "Funding Information: In addition to contributing as coauthor, B. Heim merits special acknowledgement for leading the MAPP effort and for the countless hours spent creating MAPP. At Purdue, we would like to acknowledge and thank M. Gonzalez for his assistance in CAD design, modeling parts of the probe, and help in assembling MAPP; E. Collins for his design of the analyze power supplies; D. L. Rokusek for determining many of the specifications needed for the analysis equipment. We also thank and acknowledge W. Blanchard, H. W. Kugel, and M.G. Bell at Princeton Plasma Physics Laboratory (PPPL) for their input on the design, safety, and integration; the many PPPL technicians, draftsmen, and engineers for their development of MAPP support structures and maintenance; M. Nieto for his help with TDS calculations. Work supported by Department of Energy (DOE) (Grant Nos. DE-FG02-09ER55015 and DE-AC02-09CH11466).",
year = "2012",
month = oct,
doi = "10.1063/1.4729262",
language = "English (US)",
volume = "83",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "10",
}