Maxwell stress distributions in chiral sculptured thin films due to obliquely incident plane waves

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

When a circularly polarized plane wave is obliquely incident on a chiral sculptured thin film (STF), the Maxwell stress dyadic exhibits a decreasing periodic variation across the thickness of the film. Normal and tangential surface tractions exist on the two faces of the chiral STF, as well as a net normal pressure across the film. These stresses are affected by the incidence angle of light, and are maximized when (i) the incident plane wave and the chiral STF are co-handed, (ii) the wavelength falls within a regime called the Bragg regime, (iii) the ratio of film thickness to the structural period of the chiral STF reaches a saturation value, and (iv) the deviation from normal incidence is small.

Original languageEnglish (US)
Pages (from-to)1-9
Number of pages9
JournalOptics Communications
Volume275
Issue number1
DOIs
StatePublished - Jul 1 2007

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stress distribution
Stress concentration
plane waves
Thin films
thin films
incidence
dyadics
traction
Film thickness
periodic variations
film thickness
deviation
saturation
Wavelength
wavelengths

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

Cite this

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abstract = "When a circularly polarized plane wave is obliquely incident on a chiral sculptured thin film (STF), the Maxwell stress dyadic exhibits a decreasing periodic variation across the thickness of the film. Normal and tangential surface tractions exist on the two faces of the chiral STF, as well as a net normal pressure across the film. These stresses are affected by the incidence angle of light, and are maximized when (i) the incident plane wave and the chiral STF are co-handed, (ii) the wavelength falls within a regime called the Bragg regime, (iii) the ratio of film thickness to the structural period of the chiral STF reaches a saturation value, and (iv) the deviation from normal incidence is small.",
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Maxwell stress distributions in chiral sculptured thin films due to obliquely incident plane waves. / Ross, Benjamin M.; Lakhtakia, Akhlesh; Lissenden, III, Clifford Jesse.

In: Optics Communications, Vol. 275, No. 1, 01.07.2007, p. 1-9.

Research output: Contribution to journalArticle

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