Measurement of Stokes parameters of materials at 1064-nm and 532-nm wavelengths

Songxin Tan, Ram Mohan Narayanan, James E. Kalshoven

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Laser radar systems have found wide applications in the field of remote sensing. Reflectance as well as polarization features are used together for applications ranging from environmental monitoring to target classification. The Stokes parameters are ideal quantities for characterizing the above features because they provide useful information on both light intensity and polarization state. The University of Nebraska is currently refurbishing an airborne multi-wavelength laser radar system based on the NASA Goddard Space Flight Center (GSFC) developed Airborne Laser Polarimetric Sensor (ALPS). The system uses a Nd:YAG laser operating at wavelengths of 1064-nm and 532-nm, and contains four channels at each wavelength to measure the polarization states. This system was used to measure the Stokes parameters of backscattered laser light from different materials. These included canvas tarp, white paper, plywood, concrete, aluminum plate and black anodized aluminum plate. The data provide an understanding of the polarized scattering properties of various materials, and are expected to be useful in developing target discrimination algorithms.

Original languageEnglish (US)
Pages (from-to)263-271
Number of pages9
JournalProceedings of SPIE-The International Society for Optical Engineering
Volume4377
DOIs
StatePublished - Jan 1 2001

Fingerprint

Stokes
Optical radar
Wavelength
Polarization
Radar systems
Laser Radar
Aluminum
optical radar
Lasers
polarization
plywood
wavelengths
airborne lasers
aluminum
Plywood
environmental monitoring
space flight
Laser
Space flight
luminous intensity

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

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Measurement of Stokes parameters of materials at 1064-nm and 532-nm wavelengths. / Tan, Songxin; Narayanan, Ram Mohan; Kalshoven, James E.

In: Proceedings of SPIE-The International Society for Optical Engineering, Vol. 4377, 01.01.2001, p. 263-271.

Research output: Contribution to journalArticle

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