Measurement of thermal expansion using a variable area slit method

C. S. Vikram, D. K. Agrawal, R. Roy, H. A. McKinstry

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The light reflected from a mirror on a probe, which is positioned on both sample and reference rods, is rotated by uneven thermal expansions of the two materials. A simple method is described to measure this rotation and hence the thermal expansion using a variable area slit and photodetector combination. The method is capable of determining very low thermal expansions of ceramic materials with high precision and accuracy. A measurement sensitivity of 10-6 for ΔL/L can easily be obtained.

Original languageEnglish (US)
Pages (from-to)45-47
Number of pages3
JournalOptics and Laser Technology
Volume20
Issue number1
DOIs
StatePublished - Feb 1988

Fingerprint

Thermal expansion
slits
thermal expansion
Ceramic materials
Photodetectors
photometers
Mirrors
rods
ceramics
mirrors
probes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

Vikram, C. S. ; Agrawal, D. K. ; Roy, R. ; McKinstry, H. A. / Measurement of thermal expansion using a variable area slit method. In: Optics and Laser Technology. 1988 ; Vol. 20, No. 1. pp. 45-47.
@article{7971c59ab0d14aad98153ccbcb26b8b2,
title = "Measurement of thermal expansion using a variable area slit method",
abstract = "The light reflected from a mirror on a probe, which is positioned on both sample and reference rods, is rotated by uneven thermal expansions of the two materials. A simple method is described to measure this rotation and hence the thermal expansion using a variable area slit and photodetector combination. The method is capable of determining very low thermal expansions of ceramic materials with high precision and accuracy. A measurement sensitivity of 10-6 for ΔL/L can easily be obtained.",
author = "Vikram, {C. S.} and Agrawal, {D. K.} and R. Roy and McKinstry, {H. A.}",
year = "1988",
month = "2",
doi = "10.1016/0030-3992(88)90013-8",
language = "English (US)",
volume = "20",
pages = "45--47",
journal = "Optics and Laser Technology",
issn = "0030-3992",
publisher = "Elsevier Limited",
number = "1",

}

Measurement of thermal expansion using a variable area slit method. / Vikram, C. S.; Agrawal, D. K.; Roy, R.; McKinstry, H. A.

In: Optics and Laser Technology, Vol. 20, No. 1, 02.1988, p. 45-47.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Measurement of thermal expansion using a variable area slit method

AU - Vikram, C. S.

AU - Agrawal, D. K.

AU - Roy, R.

AU - McKinstry, H. A.

PY - 1988/2

Y1 - 1988/2

N2 - The light reflected from a mirror on a probe, which is positioned on both sample and reference rods, is rotated by uneven thermal expansions of the two materials. A simple method is described to measure this rotation and hence the thermal expansion using a variable area slit and photodetector combination. The method is capable of determining very low thermal expansions of ceramic materials with high precision and accuracy. A measurement sensitivity of 10-6 for ΔL/L can easily be obtained.

AB - The light reflected from a mirror on a probe, which is positioned on both sample and reference rods, is rotated by uneven thermal expansions of the two materials. A simple method is described to measure this rotation and hence the thermal expansion using a variable area slit and photodetector combination. The method is capable of determining very low thermal expansions of ceramic materials with high precision and accuracy. A measurement sensitivity of 10-6 for ΔL/L can easily be obtained.

UR - http://www.scopus.com/inward/record.url?scp=0023961062&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0023961062&partnerID=8YFLogxK

U2 - 10.1016/0030-3992(88)90013-8

DO - 10.1016/0030-3992(88)90013-8

M3 - Article

AN - SCOPUS:0023961062

VL - 20

SP - 45

EP - 47

JO - Optics and Laser Technology

JF - Optics and Laser Technology

SN - 0030-3992

IS - 1

ER -