Measurement of thermal expansion using a variable area slit method

C. S. Vikram, D. K. Agrawal, R. Roy, H. A. McKinstry

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The light reflected from a mirror on a probe, which is positioned on both sample and reference rods, is rotated by uneven thermal expansions of the two materials. A simple method is described to measure this rotation and hence the thermal expansion using a variable area slit and photodetector combination. The method is capable of determining very low thermal expansions of ceramic materials with high precision and accuracy. A measurement sensitivity of 10-6 for ΔL/L can easily be obtained.

Original languageEnglish (US)
Pages (from-to)45-47
Number of pages3
JournalOptics and Laser Technology
Volume20
Issue number1
DOIs
StatePublished - Feb 1988

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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