Measurements of elastic constants in thin films of colossal magnetoresistance material

Jin H. So, J. R. Gladden, Y. H. Hu, J. D. Maynard, Qi Li

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

The first measurements of elastic constants, together with resistivity, of both unstrained and strained colossal magnetoresistance (CMR) material in the form of thin films on a substrate are reported. Briefly, the results show that changes in the elastic constants occur at the temperature of peak resistance, which decreases as the film thickness decreases. Furthermore, changes in the elastic constants are also observed at temperatures about 17K higher than the peak resistance temperature, which is a new result for the CMR material studied.

Original languageEnglish (US)
Pages (from-to)036103/1-036103/4
JournalPhysical Review Letters
Volume90
Issue number3
StatePublished - Jan 24 2003

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elastic properties
thin films
temperature
film thickness
electrical resistivity

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

So, J. H., Gladden, J. R., Hu, Y. H., Maynard, J. D., & Li, Q. (2003). Measurements of elastic constants in thin films of colossal magnetoresistance material. Physical Review Letters, 90(3), 036103/1-036103/4.
So, Jin H. ; Gladden, J. R. ; Hu, Y. H. ; Maynard, J. D. ; Li, Qi. / Measurements of elastic constants in thin films of colossal magnetoresistance material. In: Physical Review Letters. 2003 ; Vol. 90, No. 3. pp. 036103/1-036103/4.
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So, JH, Gladden, JR, Hu, YH, Maynard, JD & Li, Q 2003, 'Measurements of elastic constants in thin films of colossal magnetoresistance material', Physical Review Letters, vol. 90, no. 3, pp. 036103/1-036103/4.

Measurements of elastic constants in thin films of colossal magnetoresistance material. / So, Jin H.; Gladden, J. R.; Hu, Y. H.; Maynard, J. D.; Li, Qi.

In: Physical Review Letters, Vol. 90, No. 3, 24.01.2003, p. 036103/1-036103/4.

Research output: Contribution to journalArticle

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So JH, Gladden JR, Hu YH, Maynard JD, Li Q. Measurements of elastic constants in thin films of colossal magnetoresistance material. Physical Review Letters. 2003 Jan 24;90(3):036103/1-036103/4.