Measurements of Si hybrid CMOS X-Ray detector characteristics

Stephen D. Bongiorno, Abe D. Falcone, David N. Burrows, Robert Cook, Yibin Bai, Mark Farris

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations

Abstract

The development of Hybrid CMOS Detectors (HCDs) for X-Ray telescope focal planes will place them in contention with CCDs on future satellite missions due to their faster frame rates, flexible readout scenarios, lower power consumption, and inherent radiation hardness. CCDs have been used with great success on the current generation of X-Ray telescopes (e.g. Chandra, XMM, Suzaku, and Swift). However their bucket-brigade readout architecture, which transfers charge across the chip with discrete component readout electronics, results in clockrate limited readout speeds that cause pileup (saturation) of bright sources and an inherent susceptibility to radiation induced displacement damage that limits mission lifetime. In contrast, HCDs read pixels with low power, on-chip multiplexer electronics in a random access fashion. Faster frame rates achieved with multi-output readout design will allow the next generation's larger effective area telescopes to observe bright sources free of pileup. Radiation damaged lattice sites effect a single pixel instead of an entire row. Random access, multi-output readout will allow for novel readout modes such as simultaneous bright-source-fast/whole-chip-slow readout. In order for HCDs to be useful as X-Ray detectors, they must show noise and energy resolution performance similar to CCDs while retaining advantages inherent to HCDs. We will report on readnoise, conversion gain, and energy resolution measurements of an X-Ray enhanced Teledyne HAWAII-1RG (H1RG) HCD and describe techniques of H1RG data reduction.

Original languageEnglish (US)
Title of host publicationUV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVI
DOIs
StatePublished - Dec 1 2009
EventUV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVI - San Diego, CA, United States
Duration: Aug 3 2009Aug 3 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7435
ISSN (Print)0277-786X

Other

OtherUV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVI
CountryUnited States
CitySan Diego, CA
Period8/3/098/3/09

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Bongiorno, S. D., Falcone, A. D., Burrows, D. N., Cook, R., Bai, Y., & Farris, M. (2009). Measurements of Si hybrid CMOS X-Ray detector characteristics. In UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVI [74350E] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7435). https://doi.org/10.1117/12.826515