Measuring particle diameter and particle - Particle gap with nanometer precision using an optical microscope

P. K. Thwar, Darrell Velegol

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A simple optical microscopy method has been developed for measuring particle diameters and particle - particle gaps with a precision of a few nanometers. The method uses an inexpensive and straightforward image-processing technique to examine optical microscope images of the particles, which can be wet or dry. The technique is demonstrated on polystyrene latex and silica particles with diameters greater than 450 nm suspended in KCl solutions, and the measured particle diameters compare to within a few percent with those measured by electron microscopy and light scattering. In addition, changes in the gap between two colloidal spheres were measured with nanometer precision, a result that will have important implications for measuring colloidal force profiles between two Brownian particles.

Original languageEnglish (US)
Pages (from-to)3042-3047
Number of pages6
JournalIndustrial and Engineering Chemistry Research
Volume40
Issue number14
DOIs
StatePublished - Jul 11 2001

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Latexes
Silicon Dioxide
Light scattering
Electron microscopy
Particles (particulate matter)
Optical microscopy
Polystyrenes
Image processing
Microscopes
Silica
styrofoam

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Chemical Engineering(all)
  • Industrial and Manufacturing Engineering

Cite this

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Measuring particle diameter and particle - Particle gap with nanometer precision using an optical microscope. / Thwar, P. K.; Velegol, Darrell.

In: Industrial and Engineering Chemistry Research, Vol. 40, No. 14, 11.07.2001, p. 3042-3047.

Research output: Contribution to journalArticle

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