Measuring the soft X-ray quantum efficiency of charge-coupled devices using continuum synchrotron radiation

R. P. Kraft, John Andrew Nousek, D. H. Lumb, David Nelson Burrows, M. A. Skinner, G. P. Garmire

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

We have measured the soft X-ray (250-4500 eV) quantum efficiency of a charge-coupled device using continuum synchrotron radiation. The spectrum of the synchrotron radiation can be calculated accurately, so the observed pulse height spectrum is a direct measure of the detector efficiency over the synchrotron bandpass. A key function in modeling the efficiency is the energy dependence of the fraction of detected single pixel events. We find that a model including the effects of charge drift and diffusion plus two different depletion depths (corresponding to the collection and barrier phases under the gates) is required. With this model the absolute QE can be determined to within ∼5% everywhere over the 500 to 4500 eV bandpass.

Original languageEnglish (US)
Pages (from-to)192-202
Number of pages11
JournalNuclear Inst. and Methods in Physics Research, A
Volume366
Issue number1
DOIs
StatePublished - Nov 21 1995

Fingerprint

Synchrotron radiation
Quantum efficiency
Charge coupled devices
quantum efficiency
charge coupled devices
synchrotron radiation
continuums
X rays
pulse amplitude
Synchrotrons
synchrotrons
depletion
x rays
Pixels
pixels
Detectors
detectors
energy

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

@article{fdcfd2b8993b4abbaceb1b2bdb7e947c,
title = "Measuring the soft X-ray quantum efficiency of charge-coupled devices using continuum synchrotron radiation",
abstract = "We have measured the soft X-ray (250-4500 eV) quantum efficiency of a charge-coupled device using continuum synchrotron radiation. The spectrum of the synchrotron radiation can be calculated accurately, so the observed pulse height spectrum is a direct measure of the detector efficiency over the synchrotron bandpass. A key function in modeling the efficiency is the energy dependence of the fraction of detected single pixel events. We find that a model including the effects of charge drift and diffusion plus two different depletion depths (corresponding to the collection and barrier phases under the gates) is required. With this model the absolute QE can be determined to within ∼5{\%} everywhere over the 500 to 4500 eV bandpass.",
author = "Kraft, {R. P.} and Nousek, {John Andrew} and Lumb, {D. H.} and Burrows, {David Nelson} and Skinner, {M. A.} and Garmire, {G. P.}",
year = "1995",
month = "11",
day = "21",
doi = "10.1016/0168-9002(95)00526-9",
language = "English (US)",
volume = "366",
pages = "192--202",
journal = "Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",
issn = "0168-9002",
publisher = "Elsevier",
number = "1",

}

Measuring the soft X-ray quantum efficiency of charge-coupled devices using continuum synchrotron radiation. / Kraft, R. P.; Nousek, John Andrew; Lumb, D. H.; Burrows, David Nelson; Skinner, M. A.; Garmire, G. P.

In: Nuclear Inst. and Methods in Physics Research, A, Vol. 366, No. 1, 21.11.1995, p. 192-202.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Measuring the soft X-ray quantum efficiency of charge-coupled devices using continuum synchrotron radiation

AU - Kraft, R. P.

AU - Nousek, John Andrew

AU - Lumb, D. H.

AU - Burrows, David Nelson

AU - Skinner, M. A.

AU - Garmire, G. P.

PY - 1995/11/21

Y1 - 1995/11/21

N2 - We have measured the soft X-ray (250-4500 eV) quantum efficiency of a charge-coupled device using continuum synchrotron radiation. The spectrum of the synchrotron radiation can be calculated accurately, so the observed pulse height spectrum is a direct measure of the detector efficiency over the synchrotron bandpass. A key function in modeling the efficiency is the energy dependence of the fraction of detected single pixel events. We find that a model including the effects of charge drift and diffusion plus two different depletion depths (corresponding to the collection and barrier phases under the gates) is required. With this model the absolute QE can be determined to within ∼5% everywhere over the 500 to 4500 eV bandpass.

AB - We have measured the soft X-ray (250-4500 eV) quantum efficiency of a charge-coupled device using continuum synchrotron radiation. The spectrum of the synchrotron radiation can be calculated accurately, so the observed pulse height spectrum is a direct measure of the detector efficiency over the synchrotron bandpass. A key function in modeling the efficiency is the energy dependence of the fraction of detected single pixel events. We find that a model including the effects of charge drift and diffusion plus two different depletion depths (corresponding to the collection and barrier phases under the gates) is required. With this model the absolute QE can be determined to within ∼5% everywhere over the 500 to 4500 eV bandpass.

UR - http://www.scopus.com/inward/record.url?scp=0001240728&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0001240728&partnerID=8YFLogxK

U2 - 10.1016/0168-9002(95)00526-9

DO - 10.1016/0168-9002(95)00526-9

M3 - Article

AN - SCOPUS:0001240728

VL - 366

SP - 192

EP - 202

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

SN - 0168-9002

IS - 1

ER -