Mechanical behavior of 30-50 nm thick aluminum films under uniaxial tension

Md Amanul Haque, M. T. A Saif

Research output: Contribution to journalArticle

109 Citations (Scopus)

Abstract

We present uniaxial tensile test results for 30-50 nm thick freestanding aluminum films. Young's modulus and ductility were found to decrease monotonically with grain size. Reverse Hall-Petch behavior was observed with no appreciable room temperature creep. Non-linear elasticity with small irreversible deformation was observed for 50 nm thick specimens.

Original languageEnglish (US)
Pages (from-to)863-867
Number of pages5
JournalScripta Materialia
Volume47
Issue number12
DOIs
StatePublished - Dec 1 2002

Fingerprint

tensile tests
Aluminum
ductility
Ductility
Elasticity
modulus of elasticity
Creep
elastic properties
Elastic moduli
grain size
aluminum
room temperature
Temperature

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys

Cite this

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Mechanical behavior of 30-50 nm thick aluminum films under uniaxial tension. / Haque, Md Amanul; A Saif, M. T.

In: Scripta Materialia, Vol. 47, No. 12, 01.12.2002, p. 863-867.

Research output: Contribution to journalArticle

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