Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories: Invited Paper

Karthikeyan Nagarajan, Mohammad Nasim Imtiaz Khan, Sina Sayyah Ensan, Abdullah Ash-Saki, Swaroop Ghosh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Emerging non-volatile memory (NVM) technologies are being aggressively explored to replace and/or assist conventional CMOS technology. Although NVMs can cut down leakage power, achieve low footprint and allow compute capability along with storage, they suffer from new sources of variability. We review the noise sources associated with NVMs and describe resilience enhancement techniques for both memory and computing. We also present security applications where noise and variability is desirable.

Original languageEnglish (US)
Title of host publication2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
EditorsDimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages224-227
Number of pages4
ISBN (Electronic)9781728124902
DOIs
StatePublished - Jul 2019
Event25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 - Rhodes, Greece
Duration: Jul 1 2019Jul 3 2019

Publication series

Name2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

Conference

Conference25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
CountryGreece
CityRhodes
Period7/1/197/3/19

All Science Journal Classification (ASJC) codes

  • Artificial Intelligence
  • Computer Networks and Communications
  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality

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    Nagarajan, K., Khan, M. N. I., Ensan, S. S., Ash-Saki, A., & Ghosh, S. (2019). Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories: Invited Paper. In D. Gizopoulos, D. Alexandrescu, P. Papavramidou, & M. Maniatakos (Eds.), 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 (pp. 224-227). [8854412] (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IOLTS.2019.8854412