MEMS testbed for mechanical testing of nanowires

A. V. Desai, Md Amanul Haque, P. C. Eklund

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we present a MEMS test bed for electromechanical testing of nanowires and nanotubes. The MEMS device exploits the mechanics of post buckling deformation of slender columns to achieve very high force and displacement resolution. The proposed technique involves manipulating the nanowire or nanotube to the device site and hence is applicable to any type of one-dimensional solid. Initial experiments on semiconducting ZnO nanowires estimated the elastic modulus to be 1 GPa.

Original languageEnglish (US)
Title of host publicationAmerican Society of Mechanical Engineers, Micro-Electro Mechanical Systems Division, (Publications) MEMS
Pages365-368
Number of pages4
DOIs
StatePublished - Dec 1 2005
Event2005 ASME International Mecahnical Engineering Congress and Exposition, IMECE 2005 - Orlando, FL, United States
Duration: Nov 5 2005Nov 11 2005

Publication series

NameAmerican Society of Mechanical Engineers, Micro-Electro Mechanical Systems Division, (Publications) MEMS
Volume7 MEMS
ISSN (Print)1096-665X

Other

Other2005 ASME International Mecahnical Engineering Congress and Exposition, IMECE 2005
CountryUnited States
CityOrlando, FL
Period11/5/0511/11/05

All Science Journal Classification (ASJC) codes

  • Mechanical Engineering
  • Electrical and Electronic Engineering
  • Control and Systems Engineering

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