Metal nanoparticle deposition for TOF-SIMS signal enhancement of polymers

Abigale Marcus, Nicholas Winograd

Research output: Contribution to journalArticle

36 Citations (Scopus)

Abstract

A novel technique for improved time-of-flight secondary ion mass spectra of polymer ions is presented. This, technique is a simple preparatory method, which involves deposition of a submonolayer coverage of metal nanoparticles on the surface of a polymer sample enabling an overall increase in characteristic polymer ions. This procedure gives spectra with enhanced intensity, a larger number of characteristic polymer peaks, and peaks of higher mass. Both Au and Ag nanoparticles were employed to facilitate the ionization of the polymer characteristic secondary ions. Moreover, these experiments demonstrate that the nanoparticles allow localization of high-mass fragment ions during imaging experiments utilizing focused ion beams. In general, we show that the metal nanoparticle deposition method is effective for time-of-flight secondary ion mass spectrometry examination of polymers.

Original languageEnglish (US)
Pages (from-to)141-148
Number of pages8
JournalAnalytical chemistry
Volume78
Issue number1
DOIs
StatePublished - Jan 1 2006

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Metal nanoparticles
Secondary ion mass spectrometry
Polymers
Ions
Nanoparticles
Focused ion beams
Ionization
Experiments
Imaging techniques

All Science Journal Classification (ASJC) codes

  • Analytical Chemistry

Cite this

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Metal nanoparticle deposition for TOF-SIMS signal enhancement of polymers. / Marcus, Abigale; Winograd, Nicholas.

In: Analytical chemistry, Vol. 78, No. 1, 01.01.2006, p. 141-148.

Research output: Contribution to journalArticle

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