Metasurfaces with thermal hysteresis

Mark Clemente-Arenas, Julio Urbina, Akhlesh Lakhtakia

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

As temperature cycles between 58 °C and 72 °C, VO2 undergoes a hysteretic transformation between the monoclinic phase and rutile phases, leading to a cyclical change in the complex refractive index that is indicative of semiconductor↔metal transitions. We simulated the visible/near-infrared spectra of the specular reflectance and transmittance of a metasurface incorporating a VO2 sheet and found that the extrema in both spectra blueshift from the cooling to the heating phases at a fixed temperature. This phenomenon is attractive for sensing temporal gradients of temperature.

Original languageEnglish (US)
Title of host publicationProceedings of the 2018 20th International Conference on Electromagnetics in Advanced Applications, ICEAA 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages296-298
Number of pages3
ISBN (Electronic)9781538667620
DOIs
StatePublished - Nov 1 2018
Event20th International Conference on Electromagnetics in Advanced Applications, ICEAA 2018 - Cartagena de Indias, Colombia
Duration: Sep 10 2018Sep 14 2018

Publication series

NameProceedings of the 2018 20th International Conference on Electromagnetics in Advanced Applications, ICEAA 2018

Other

Other20th International Conference on Electromagnetics in Advanced Applications, ICEAA 2018
CountryColombia
CityCartagena de Indias
Period9/10/189/14/18

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All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Instrumentation

Cite this

Clemente-Arenas, M., Urbina, J., & Lakhtakia, A. (2018). Metasurfaces with thermal hysteresis. In Proceedings of the 2018 20th International Conference on Electromagnetics in Advanced Applications, ICEAA 2018 (pp. 296-298). [8520495] (Proceedings of the 2018 20th International Conference on Electromagnetics in Advanced Applications, ICEAA 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICEAA.2018.8520495