Microscopic insights into the sputtering of Ag{111} induced by C 60 and Ga bombardment

Zbigniew Postawa, Bartlomiej Czerwinski, Marek Szewczyk, Edward J. Smiley, Nicholas Winograd, Barbara J. Garrison

Research output: Contribution to journalArticlepeer-review

159 Citations (SciVal)

Abstract

Molecular dynamics computer simulations have been utilized to compare the differences in the mechanism of sputtering of Ag{111} by kiloelectronvolt Ga and C 60 projectiles. The calculated kinetic energy distributions of Ag monomers and Ag 2 dimers compare favorably with experimental results. The damage caused by the C 60 particle left in the sample is less than the depth of material that the next impinging C 60 particle would remove, thus supporting the preliminary experimental observations that molecular depth profiling is possible with C 60 projectile beams.

Original languageEnglish (US)
Pages (from-to)7831-7838
Number of pages8
JournalJournal of Physical Chemistry B
Volume108
Issue number23
DOIs
StatePublished - Jun 10 2004

All Science Journal Classification (ASJC) codes

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Materials Chemistry

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